Search Results - Wespel, M.

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  1. 1
    Trapping Effects at the Drain Edge in 600 V GaN-on-Si HEMTs

    Trapping Effects at the Drain Edge in 600 V GaN-on-Si HEMTs by Wespel, M., Polyakov, V. M., Dammann, M., Reiner, R., Waltereit, P., Quay, R., Mikulla, M., Ambacher, O.

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  2. 2
    Influence of surface states on the voltage robustness of AlGaN/GaN HFET power devices

    Influence of surface states on the voltage robustness of AlGaN/GaN HFET power devices by Wespel, M., Baeumler, M., Polyakov, V., Dammann, M., Reiner, R., Waltereit, P., Quay, R., Mikulla, M., Ambacher, O.

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  3. 3
    Monolithically-Integrated Mulitlevel Inverter on Lateral GaN-on-Si Technology for High-Voltage Applications

    Monolithically-Integrated Mulitlevel Inverter on Lateral GaN-on-Si Technology for High-Voltage Applications by Weiss, B., Reiner, R., Waltereit, P., Muller, S., Wespel, M., Quay, R., Ambacher, O.

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  4. 4
    Degradation of 0.25μm GaN HEMTs under high temperature stress test

    Degradation of 0.25μm GaN HEMTs under high temperature stress test by Dammann, M., Baeumler, M., Brückner, P., Bronner, W., Maroldt, S., Konstanzer, H., Wespel, M., Quay, R., Mikulla, M., Graff, A., Lorenzini, M., Fagerlind, M., van der Wel, P.J., Roedle, T.

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  5. 5
    High-voltage stress time-dependent dispersion effects in AlGaN/GaN HEMTs

    High-voltage stress time-dependent dispersion effects in AlGaN/GaN HEMTs by Wespel, M., Dammann, M., Polyakov, V., Reiner, R., Waltereit, P., Weiss, B., Quay, R., Mikulla, M., Ambacher, O.

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  6. 6
    Benchmarking of Large-Area GaN-on-Si HFET Power Devices for Highly-Efficient, Fast-Switching Converter Applications

    Benchmarking of Large-Area GaN-on-Si HFET Power Devices for Highly-Efficient, Fast-Switching Converter Applications by Reiner, R., Waltereit, P., Benkhelifa, F., Muller, S., Wespel, M., Quay, R., Schlechtweg, M., Mikulla, M., Ambacher, O.

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  7. 7
    Reliability of GaN HEMTs with a 100 nm gate length under DC-stress tests

    Reliability of GaN HEMTs with a 100 nm gate length under DC-stress tests by Dammann, M., Baeumler, M., Anto, R., Konstanzer, H., Bruckner, P., Polyakov, V., Wespel, M., Muller, S., Schwantuschke, D., Maroldt, S., Quay, R., Mikulla, M., Ambacher, O.

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  8. 8
    Heterobi- and -trinuclear Complexes with an Amino(ethynyl)carbene as Bridging Ligand

    Heterobi- and -trinuclear Complexes with an Amino(ethynyl)carbene as Bridging Ligand by Fischer, Helmut, Hartbaum, Cornelia, Wespel, Christiane, Dede, Markus

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