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A closed-form analysis of f/sub T/ for the bipolar transistor down to liquid nitrogen temperature
by
Tamba, N.
,
Weybright, M.E.
,
Shott, J.D.
,
Plummer, J.D.
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A 0.21 /spl mu/m/sup 2/ 7F/sup 2/ trench cell with a locally-open globally-folded dual bitline for 1 Gb/4 Gb DRAM
by
Radens, C.J.
,
Gruening, U.
,
Weybright, M.E.
,
DeBrosse, J.K.
,
Kleinhenz, R.L.
,
Hoenigschmid, H.
,
Thomas, A.C.
,
Mandelman, J.A.
,
Alsmeier, J.
,
Bronner, G.B.
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Conference Proceeding
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Conference Proceedings
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Bicmos Integrated Circuits
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1
Bipolar Transistors
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1
Capacitors
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1
Cmos Technology
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Degradation
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1
Laboratories
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Mosfets
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Nitrogen
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Optical Device Fabrication
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Productivity
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Random Access Memory
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Research And Development
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Semiconductor Device Noise
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Silicon Compounds
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Space Charge
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Tellurium
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Temperature
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Transistors
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Wiring
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X-Ray Lithography
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Ieee Electronic Library (Iel) Conference Proceedings
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Ieee Xplore All Conference Series
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