Search Results - Weyburne, D.W.

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  1. 1
    Effect of initial process conditions on the structural properties of AlN films

    Effect of initial process conditions on the structural properties of AlN films by Paduano, Q.S., Weyburne, D.W., Jasinski, J., Liliental-Weber, Z.

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  2. 2
    Inversion domains in AlN grown on (0001) sapphire

    Inversion domains in AlN grown on (0001) sapphire by Jasinski, J., Liliental-Weber, Z., Paduano, Q. S., Weyburne, D. W.

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  3. 3
    An X-ray diffraction technique for analyzing structural defects including microstrain in nitride materials

    An X-ray diffraction technique for analyzing structural defects including microstrain in nitride materials by Paduano, Q.S., Weyburne, D.W., Drehman, A.J.

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  4. 4
    Flow visualization studies for optimization of OMVPE reactor design

    Flow visualization studies for optimization of OMVPE reactor design by Wang, C.A., Groves, S.H., Palmateer, S.C., Weyburne, D.W., Brown, R.A.

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  5. 5
    Use of flow visualization and tracer gas studies for designing an InP/InGaAsP OMVPE reactor

    Use of flow visualization and tracer gas studies for designing an InP/InGaAsP OMVPE reactor by Palmateer, S.C., Groves, S.H., Wang, C.A., Weyburne, D.W., Brown, R.A.

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  6. 6
    Close-spaced MOCVD reactor for 1%-uniformity growth of In-containing materials on 4" substrates

    Close-spaced MOCVD reactor for 1%-uniformity growth of In-containing materials on 4" substrates by Vernon, S.M., Colter, P.C., McNulty, D.D., Hogan, S.J., Weyburne, D.W., Ahern, B.S.

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