Search Results - Wien, W.H.A.

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  1. 1
    Bulk-micromachined test structure for fast and reliable determination of the lateral thermal conductivity of thin films

    Bulk-micromachined test structure for fast and reliable determination of the lateral thermal conductivity of thin films by LA SPINA, Luigi, VAN HERWAARDEN, Alexander W, SCHELLEVIS, Hugo, WIEN, Wim H. A, NENADOVIC, Nebojsa, NANVER, Lis K

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  2. 2
    Two-Dimensional Fiber Positioning and Clamping Device for Product-Internal Microassembly

    Two-Dimensional Fiber Positioning and Clamping Device for Product-Internal Microassembly by Henneken, V.A., Sassen, W.P., van der Vlist, W., Wien, W.H.A., Tichem, M., Sarro, P.M.

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    MEMS test structure for measuring thermal conductivity of thin films

    MEMS test structure for measuring thermal conductivity of thin films by La Spina, L., Nenadovic, N., van Herwaarden, A.W., Schellevis, H., Wien, W.H.A., Nanver, L.K.

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