The European Standard Reference Method systematically underestimates particulate matter in stack emissions by Antonsson, Egill, Cordes, Jens, Stoffels, Benno, Wildanger, Dominik

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Nanoscale Engineering and Optical Addressing of Single Spins in Diamond by Pezzagna, Sébastien, Wildanger, Dominik, Mazarov, Paul, Wieck, Andreas D., Sarov, Yanko, Rangelow, Ivo, Naydenov, Boris, Jelezko, Fedor, Hell, Stefan W., Meijer, Jan

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Diffraction unlimited all-optical recording of electron spin resonances by Wildanger, Dominik, Maze, Jeronimo R, Hell, Stefan W

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Simultaneous multi-lifetime multi-color STED imaging for colocalization analyses by Bückers, Johanna, Wildanger, Dominik, Vicidomini, Giuseppe, Kastrup, Lars, Hell, Stefan W

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3D reconstruction of high-resolution STED microscope images by Punge, Annedore, Rizzoli, Silvio O., Jahn, Reinhard, Wildanger, Jan Dominik, Meyer, Lars, Schönle, Andreas, Kastrup, Lars, Hell, Stefan W.

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STED microscopy with a supercontinuum laser source by Wildanger, Dominik, Rittweger, Eva, Kastrup, Lars, Hell, Stefan W

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Screening and engineering of colour centres in diamond by Lühmann, Tobias, Raatz, Nicole, John, Roger, Lesik, Margarita, Rödiger, Jasper, Portail, Marc, Wildanger, Dominik, Kleißler, Felix, Nordlund, Kai, Zaitsev, Alexander, Roch, Jean-François, Tallaire, Alexandre, Meijer, Jan, Pezzagna, Sébastien

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Scents in the stack: olfactometric proficiency testing with an emission simulation apparatus by Stöckel, Stephan, Cordes, Jens, Stoffels, Benno, Wildanger, Dominik

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Solid Immersion Facilitates Fluorescence Microscopy with Nanometer Resolution and Sub-Ångström Emitter Localization by Wildanger, Dominik, Patton, Brian R., Schill, Heiko, Marseglia, Luca, Hadden, J. P., Knauer, Sebastian, Schönle, Andreas, Rarity, John G., O'Brien, Jeremy L., Hell, Stefan W., Smith, Jason M.

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A STED microscope aligned by design by Wildanger, Dominik, Bückers, Johanna, Westphal, Volker, Hell, Stefan W, Kastrup, Lars

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The question of homogeneity inside a chimney: application of ISO 13528 to stack emission proficiency tests by Cordes, Jens, Stoffels, Benno, Wildanger, Dominik

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Dual-Color STED Microscopy at 30-nm Focal-Plane Resolution by Meyer, Lars, Wildanger, Dominik, Medda, Rebecca, Punge, Annedore, Rizzoli, Silvio O., Donnert, Gerald, Hell, Stefan W.

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Combining UK and German emissions monitoring proficiency testing data based on stack simulator facilities to determine whether increasingly stringent EU emission limits are enforce... by Coleman, Marc D., Smith, Thomas O. M., Robinson, Rod A., Stoffels, Benno, Wildanger, Dominik

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Far-field optical nanoscopy of diamond color centers by Rittweger, E., Kyu Young Han, Irvine, S.E., Wildanger, J.D., Eggeling, C., Hell, S.W.

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