Search Results - Wilderson, S.F.

  • Showing 1 - 2 results of 2
Refine Results
  1. 1
    Optical deflection measurement for characterization of microelectromechanical systems (MEMS)

    Optical deflection measurement for characterization of microelectromechanical systems (MEMS) by Firebaugh, S.L., Charles, H.K., Edwards, R.L., Keeney, A.C., Wilderson, S.F.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    Dielectric Charge Measurement in Capacitive Microwave Shunt Switches

    Dielectric Charge Measurement in Capacitive Microwave Shunt Switches by Schultz, J.S., Firebaugh, S.L., Charles, H.K., Edwards, R.L., Keeney, A.C., Wilderson, S.F.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:

Search Tools: