Search Results - Wittpahl, S.

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  1. 1
    Characterization of stressing conditions in mills – A comprehensive research strategy based on well-characterized model particles

    Characterization of stressing conditions in mills – A comprehensive research strategy based on well-characterized model particles by Strobel, A., Romeis, S., Wittpahl, S., Herre, P., Schmidt, J., Peukert, W.

    Published in Powder technology
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  2. 2
    Assessing the influence of viscosity and milling bead size on the stressing conditions in a stirred media mill by single particle probes

    Assessing the influence of viscosity and milling bead size on the stressing conditions in a stirred media mill by single particle probes by Strobel, A., Schwenger, J., Wittpahl, S., Schmidt, J., Romeis, S., Peukert, W.

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  3. 3
    Resolution and accuracy of nonlinear regression of point spread function with artificial neural networks

    Resolution and accuracy of nonlinear regression of point spread function with artificial neural networks by Lehmann, Matthias, Wittpahl, Christian, Zakour, Hatem Ben, Braun, Alexander

    Published in Optical engineering
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  4. 4
    Modeling realistic optical aberrations to reuse existing drive scene recordings for autonomous driving validation

    Modeling realistic optical aberrations to reuse existing drive scene recordings for autonomous driving validation by Lehmann, Matthias, Wittpahl, Christian, Zakour, Hatem Ben, Braun, Alexander

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  5. 5
    An analytic-numerical image flicker study to test novel flicker metrics

    An analytic-numerical image flicker study to test novel flicker metrics by Wittpahl, Christian, Deegan, Brian, Black, Bob, Braun, Alexander

    Published in Electronic Imaging
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  6. 6
    Cantilever influence suppression of contactless IC-testing by electric force microscopy

    Cantilever influence suppression of contactless IC-testing by electric force microscopy by Wittpahl, V., Behnke, U., Wand, B., Mertin, W.

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  7. 7
    Quantitative high frequency-electric force microscope testing of monolithic microwave integrated circuits at 20 GHz

    Quantitative high frequency-electric force microscope testing of monolithic microwave integrated circuits at 20 GHz by Wittpahl, V., Ney, C., Behnke, U., Mertin, W., Kubalek, E.

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  8. 8
    Realistic Image Degradation with Measured PSF

    Realistic Image Degradation with Measured PSF by Wittpahl, Christian, Zakour, Hatem Ben, Lehmann, Matthias, Braun, Alexander

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    Conference Proceeding
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  9. 9
    Resolution and accuracy of non-linear regression of PSF with artificial neural networks

    Resolution and accuracy of non-linear regression of PSF with artificial neural networks by Lehmann, Matthias, Wittpahl, Christian, Hatem Ben Zakour, Braun, Alexander

    Published in arXiv.org
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  10. 10
    Realistic Image Degradation with Measured PSF

    Realistic Image Degradation with Measured PSF by Wittpahl, Christian, Hatem Ben Zakour, Lehmann, Matthias, Braun, Alexander

    Published in arXiv.org
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  11. 11
    Contactless gigahertz testing

    Contactless gigahertz testing by Mertin, W., Leyk, A., Behnke, U., Wittpahl, V.

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  12. 12
    A degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor

    A degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor by Wittpahl, V., Liu, Y.Y., Chan, D.S.H., Chim, W.K., Phang, J.C.H., Balk, L.J., Yan, K.P.

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