Search Results - Wittpahl, V.

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  1. 1
    Cantilever influence suppression of contactless IC-testing by electric force microscopy

    Cantilever influence suppression of contactless IC-testing by electric force microscopy by Wittpahl, V., Behnke, U., Wand, B., Mertin, W.

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  2. 2
    Quantitative high frequency-electric force microscope testing of monolithic microwave integrated circuits at 20 GHz

    Quantitative high frequency-electric force microscope testing of monolithic microwave integrated circuits at 20 GHz by Wittpahl, V., Ney, C., Behnke, U., Mertin, W., Kubalek, E.

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  3. 3
    Contactless gigahertz testing

    Contactless gigahertz testing by Mertin, W., Leyk, A., Behnke, U., Wittpahl, V.

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  4. 4
    A degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor

    A degradation monitor for the light output of LEDs based on cathodoluminescence signals and junction ideality factor by Wittpahl, V., Liu, Y.Y., Chan, D.S.H., Chim, W.K., Phang, J.C.H., Balk, L.J., Yan, K.P.

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