Search Results - Wodzro, Stuart E.

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    Single-Event Upset Cross Section at High Frequencies for RHBD Flip-Flop Designs at the 5-nm Bulk FinFET Node

    Single-Event Upset Cross Section at High Frequencies for RHBD Flip-Flop Designs at the 5-nm Bulk FinFET Node by Xiong, Yoni, Pieper, Nicholas J., Qian, Ying, Wodzro, Stuart E., Narasimham, Balaji, Fung, Rita, Wen, Shi-Jie, Bhuva, Bharat L.

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