Search Results - Wohlfartsstatter, Dominik

  • Showing 1 - 4 results of 4
Refine Results
  1. 1
    Quantitative Field Emission Imaging for Studying the Doping-Dependent Emission Behavior of Silicon Field Emitter Arrays

    Quantitative Field Emission Imaging for Studying the Doping-Dependent Emission Behavior of Silicon Field Emitter Arrays by Schels, Andreas, Herdl, Florian, Hausladen, Matthias, Wohlfartsstätter, Dominik, Edler, Simon, Bachmann, Michael, Pahlke, Andreas, Schreiner, Rupert, Hansch, Walter

    Published in Micromachines (Basel)
    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    Measurement of field emission array current distributions by metal-coated CMOS image sensors

    Measurement of field emission array current distributions by metal-coated CMOS image sensors by Hausladen, Mattias, Schels, Andreas, Buchner, Philipp, Bartl, Mathias, Asgharzade, Ali, Edler, Simon, Wohlfartsstätter, Dominik, Bachmann, Michael, Schreiner, Rupert

    Get full text
    Article
    Save to List
    Saved in:
  3. 3
    Improved Method for Determining the Distribution of FEA Currents by Optical CMOS Sensors

    Improved Method for Determining the Distribution of FEA Currents by Optical CMOS Sensors by Hausladen, Matthias, Schels, Andreas, Buchner, Philipp, Bartl, Mathias, Asgharzade, Ali, Edler, Simon, Wohlfartsstatter, Dominik, Bachmann, Michael, Schreiner, Rupert

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  4. 4
    A novel current dependent field emission performance test

    A novel current dependent field emission performance test by Herdl, Florian, Bachmann, Michael, Wohlfartsstatter, Dominik, Dusberg, Felix, Dudeck, Markus, Eder, Magdalena, Meyer, Manuel, Pahlke, Andreas, Edler, Simon, Schels, Andreas, Hansch, Walter, Schreiner, Rupert

    Request full text
    Conference Proceeding
    Save to List
    Saved in:

Search Tools: