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Search Results - Wolters, D.R.
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Advanced modeling of silicon oxidation
by
Wolters, D.R
,
Zegers-van Duijnhoven, A.T.A
Published in
Microelectronics Reliability
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Variation of the exponent of flicker noise in MOSFETs
by
Wolters, D.R.
,
Zegers-van Duijnhoven, A.T.A.
Published in
Solid-state electronics
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Model for [formula omitted] noise in n and p MOSFETs
by
Wolters, D.R.
,
Zegers-van Duijnhoven, A.T.A.
Published in
Microelectronic engineering
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Trapping of hot electrons
by
Wolters, D.R.
,
Zegers-van Duynhoven, A.T.A.
Published in
Applied surface science
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Kinetics of dry oxidation of silicon
by
Wolters, D.R.
,
Zegers-Van Duynhoven, A.T.A.
Published in
Applied surface science
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Fowler-Nordheim tunneling in implanted MOS devices
by
Wolters, D.R.
,
Peek, H.L.
Published in
Solid-state electronics
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Thermal oxidation of silicon and residual fixed charge
by
Wolters, D.R.
,
Duijnhoven, A.T.A.Zegers-van
Published in
Microelectronics
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Demonstration of a flash memory cell with 55 /spl Aring/ EOT silicon nitride tunnel dielectric
by
Melik-Martirosian, A.
,
Ma, T.P.
,
Wang, X.W.
,
Guo, X.
,
Widdershoven, F.P.
,
Wolters, D.R.
,
van der Wal, V.J.D.
,
van Duuren, M.J.
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Conference Proceeding
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Model for 1/f noise in MOSFETs and interconnects
by
Wolters, D.R.
,
Zegers-van Duijnhoven, A.T.A.
,
Augur, R.
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Influence of Stress on the Degradation Behavior of Mg LAE442 Implant Systems
by
Denkena, B.
,
Köhler, J.
,
Stieghorst, J.
,
Turger, A.
,
Seitz, J.
,
Fau, D.R.
,
Wolters, L.
,
Angrisani, N.
,
Reifenrath, J.
,
Helmecke, P.
Published in
Procedia CIRP
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Comparison of the channel catfish, Ictalurus punctatus (NWAC103 strain) and the channel X blue catfish, I. punctatus X I. furcatus, F1 hybrid for growth, feed efficiency, processin...
by
Li, M.H
,
Robinson, E.H
,
Manning, B.B
,
Yant, D.R
,
Chatakondi, N.G
,
Bosworth, B.G
,
Wolters, W.R
Published in
Journal of applied aquaculture
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