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A 16Gb LPDDR4X SDRAM with an NBTI-tolerant circuit solution, an SWD PMOS GIDL reduction technique, an adaptive gear-down scheme and a metastable-free DQS aligner in a 10nm class DR...
by
Ki Chul Chun
,
Yong-Gyu Chu
,
Jin-Seok Heo
,
Tae-Sung Kim
,
Soohwan Kim
,
Hui-Kap Yang
,
Mi-Jo Kim
,
Chang-Kyo Lee
,
Juhwan Kim
,
Hyunchul Yoon
,
Chang-Ho Shin
,
Sanguhn Cha
,
Hyung-Jin Kim
,
Young-Sik Kim
,
Kyungryun Kim
,
Young-Ju Kim
,
Wonjun Choi
,
Dae-Sik Yim
,
Inkyu Moon
,
Junha Lee
,
Young Choi
,
Yongmin Kwon
,
Sung-Won Choi
,
Jung-Wook Kim
,
Yoon-Suk Park
,
Woongdae Kang
,
Jinil Chung
,
Seunghyun Kim
,
Yesin Ryu
,
Seong-Jin Cho
,
Hoon Shin
,
Hangyun Jung
,
Sanghyuk Kwon
,
Kyuchang Kang
,
Jongmyung Lee
,
Yujung Song
,
Young-Jae Kim
,
Eun-Ah Kim
,
Kyung-Soo Ha
,
Kyoung-Ho Kim
,
Seok-Hun Hyun
,
Seungbum Ko
,
Jung-Hwan Choi
,
Young-Soo Sohn
,
Kwang-Il Park
,
Seong-Jin Jang
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Conference Proceeding
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Degradation
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Engineering
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Engineering, Electrical & Electronic
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Error Correction Codes
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Negative Bias Temperature Instability
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Science & Technology
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Sdram
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Thermal Variables Control
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Transistors
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Ieee Electronic Library (Iel) Conference Proceedings
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