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Low overhead delay testing of ASICs
by
Gillis, P.
,
McCauley, K.
,
Woytowich, F.
,
Ferko, A.
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At-Speed Structural Test For High-Performance ASICs
by
Iyengar, V.
,
Yokota, T.
,
Yamada, K.
,
Anemikos, T.
,
Bassett, B.
,
Degregorio, M.
,
Farmer, R.
,
Grise, G.
,
Johnson, M.
,
Milton, D.
,
Taylor, M.
,
Woytowich, F.
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Delay test of chip I/Os using LSSD boundary scan
by
Gillis, P.
,
Woytowich, F.
,
McCauley, K.
,
Baur, U.
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Gross delay defect evaluation for a CMOS logic design system product
by
BULA, O
,
MOSER, J
,
TRINKO, J
,
WEISSMAN, M
,
WOYTOWICH, F
Published in
IBM journal of research and development
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An Integrated Framework for At-Speed and ATE-Driven Delay Test of Contract-Manufactured ASICs
by
Iyengar, V.
,
Pichamuthu, K.
,
Ferko, A.
,
Woytowich, F.
,
Lackey, D.
,
Grise, G.
,
Taylor, M.
,
Degregorio, M.
,
Oakland, S.
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Design For At-Speed Structural Test And Performance Verification Of High-Performance ASICs
by
Iyengar, V.
,
Johnson, M.
,
Anemikos, T.
,
Grise, G.
,
Taylor, M.
,
Farmer, R.
,
Woytowich, F.
,
Bassett, B.
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Respiratory profiles of grain handlers and sedentary workers
by
Herbert, F. A
,
Woytowich, V
,
Schram, E
,
Baldwin, D
Published in
Canadian Medical Association journal
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