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HCI Improvement on 14nm FinFET IO Device by Optimization of 3D Junction Profile
by
Wan, Xinggon
,
Zhu, Baofu
,
Mohan, Meera
,
Wu, Keija
,
Choi, Dongil
,
Gondal, Arfa
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14Nm Fin Fet
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Correlation
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Degradation
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Engineering
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Engineering, Electrical & Electronic
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Finfets
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Hci
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Human Computer Interaction
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Impact Ionization
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Io Devices
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Junctions
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Lightly Doped Drain
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Performance Evaluation
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Reliability
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Science & Technology
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Technology
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Ieee Electronic Library (Iel) Conference Proceedings
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