Search Results - YUN, Yeonam

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  1. 1
    Accurate Extraction of Effective Channel Length and Source/Drain Series Resistance in Ultrashort-Channel MOSFETs by Iteration Method

    Accurate Extraction of Effective Channel Length and Source/Drain Series Resistance in Ultrashort-Channel MOSFETs by Iteration Method by KIM, Junsoo, LEE, Jaehong, SONG, Ickhyun, YUN, Yeonam, JONG DUK LEE, PARK, Byung-Gook, SHIN, Hyungcheol

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  2. 2
    fmax Improvement by Controlling Extrinsic Parasitics in Circuit-Level MOS Transistor

    fmax Improvement by Controlling Extrinsic Parasitics in Circuit-Level MOS Transistor by JHON, Hee-Sauk, LEE, Jae-Hong, LEE, Jaeho, OH, Byoungchan, SONG, Ickhyun, YEONAM YUN, PARK, Byung-Gook, LEE, Jong-Duk, SHIN, Hyungcheol

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  3. 3
    f Improvement by Controlling Extrinsic Parasitics in Circuit-Level MOS Transistor

    f Improvement by Controlling Extrinsic Parasitics in Circuit-Level MOS Transistor by Hee-Sauk Jhon, Jae-Hong Lee, Jaeho Lee, Byoungchan Oh, Ickhyun Song, Yeonam Yun, Byung-Gook Park, Jong-Duk Lee, Hyungcheol Shin

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  4. 4
    On the Characteristics and Spatial Dependence of Channel Thermal Noise in Nanoscale Metal–Oixde–Semiconductor Field Effect Transistors

    On the Characteristics and Spatial Dependence of Channel Thermal Noise in Nanoscale Metal–Oixde–Semiconductor Field Effect Transistors by Jeon, Jongwook, Yun, Yeonam, Kim, Junsoo, Park, Byung-Gook, Lee, Jong Duk, Shin, Hyungcheol

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  5. 5
    A New Noise Parameter Model of Short-Channel MOSFETs

    A New Noise Parameter Model of Short-Channel MOSFETs by Jongwook Jeon, Ickhyun Song, In Man Kang, Yeonam Yun, Byung-Gook Park, Jong Duk Lee, Hyungcheol Shin

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  6. 6
    Small-signal modeling of MOSFET cascode with merged diffusion

    Small-signal modeling of MOSFET cascode with merged diffusion by Yun, Yeonam, Jhon, Hee-Sauk, Jeon, Jongwook, Lee, Jaehong, Shin, Hyungcheol

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  7. 7
    [Formula Omitted] Improvement by Controlling Extrinsic Parasitics in Circuit-Level MOS Transistor

    [Formula Omitted] Improvement by Controlling Extrinsic Parasitics in Circuit-Level MOS Transistor by Jhon, Hee-Sauk, Lee, Jae-Hong, Lee, Jaeho, Oh, Byoungchan, Song, Ickhyun, Yun, Yeonam, Park, Byung-Gook, Lee, Jong-Duk, Shin, Hyungcheol

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  8. 8
    Multigate MOSFET in a Bulk Technology by Integrating Polysilicon-Filled Trenches

    Multigate MOSFET in a Bulk Technology by Integrating Polysilicon-Filled Trenches by Ramadout, B., Guo-Neng Lu, Carrere, J.-P., Pinzelli, L., Perrot, C., Rivoire, M., Nemouchi, F.

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  9. 9
    f max Improvement by Controlling Extrinsic Parasitics in Circuit-Level MOS Transistor

    f max Improvement by Controlling Extrinsic Parasitics in Circuit-Level MOS Transistor by Jhon, Hee-Sauk, Lee, Jae-Hong, Lee, Jaeho, Oh, Byoungchan, Song, Ickhyun, Yun, Yeonam, Park, Byung-Gook, Lee, Jong-Duk, Shin, Hyungcheol

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  10. 10
    Extraction of Effective Carrier Velocity and Observation of Velocity Overshoot in Sub-40 ㎚ MOSFETs

    Extraction of Effective Carrier Velocity and Observation of Velocity Overshoot in Sub-40 ㎚ MOSFETs by Junsoo Kim, Jaehong Lee, Yeonam Yun, Byung-Gook Park, Jong Duk Lee, Hyungcheol Shin

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  11. 11
    Extraction of Effective Carrier Velocity in RF MOSFETs

    Extraction of Effective Carrier Velocity in RF MOSFETs by Yeonam Yun, In Man Kang, Byung-Gook Park, Jong Duk Lee, Hyungcheol Shin

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  12. 12
    Temperature dependence of effective channel length, source/drain resistance, and electron mobility in sub-50 nm MOSFETs

    Temperature dependence of effective channel length, source/drain resistance, and electron mobility in sub-50 nm MOSFETs by Kim, Junsoo, Lee, Jaehong, Yun, Yeonam, Park, Byung-Gook, Lee, Jong Duk, Shin, Hyungcheol

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