Influence of Temperature Parameters on Morphological Characteristics of Plasma Deposited Zinc Oxide Nanoparticles by Sazanova, Tatyana Sergeevna, Mochalov, Leonid Alexandrovich, Logunov, Alexander Alexandrovich, Kudryashov, Mikhail Alexandrovich, Fukina, Diana Georgievna, Vshivtsev, Maksim Anatolevich, Prokhorov, Igor Olegovich, Yunin, Pavel Andreevich, Smorodin, Kirill Alexandrovich, Atlaskin, Artem Anatolevich, Vorotyntsev, Andrey Vladimirovich

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How to distinguish between opposite faces of an a‐plane sapphire wafer by Yunin, Pavel Andreevich, Drozdov, Yurii Nikolaevich

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Polycrystalline GeSn Films Grown by Hot Wire Chemical Vapor Deposition on SiO2/Si(001) Substrates by Shengurov, Gennady Vladimirovich, Buzynin, Yury Nikolaevich, Chalkov, Vadim Yurievich, Nezhdanov, Alexey Vladimirovich, Kudrin, Alexey Vladimirovich, Yunin, Pavel Andreevich

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Polycrystalline GeSn Films Grown by Hot Wire Chemical Vapor Deposition on SiO 2 /Si(001) Substrates by Shengurov, Gennady Vladimirovich, Buzynin, Yury Nikolaevich, Chalkov, Vadim Yurievich, Nezhdanov, Alexey Vladimirovich, Kudrin, Alexey Vladimirovich, Yunin, Pavel Andreevich

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A new approach to express ToF SIMS depth profiling by Yunin, Pavel Andreevich, Drozdov, Yurii Nikolaevich, Drozdov, Mikhail Nikolaevich

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Recovery of SIMS depth profiles with account for nonstationary effects by Yunin, Pavel Andreevich, Drozdov, Yurii Nikolaevich, Drozdov, Mikhail Nikolaevich, Yurasov, Dmitry Vladimirovich

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Experimental shift allowance in the deconvolution of SIMS depth profiles by Yunin, Pavel Andreevich, Drozdov, Yurii Nikolaevich, Drozdov, Mikhail Nikolaevich

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Recovery of SIMS depth profiles with account for nonstationary effects by YUNIN, Pavel Andreevich, DROZDOVA, Yurii Nikolaevich, DROZDOVA, Mikhail Nikolaevich, YURASOV, Dmitry Vladimirovich

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