In situ E-SEM and TEM observations of the thermal annealing effects on ion-amorphized 6H-SiC single crystals and nanophased SiC fibers: Observation of thermal annealing effects on... by Huguet-Garcia, Juan, Jankowiak, Aurelien, Miro, Sandrine, Podor, Renaud, Meslin, Estelle, Serruys, Yves, Costantini, Jean-Marc

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Au ion irradiation of various silicon carbide fiber-reinforced SiC matrix composites by Chaâbane, Nihed, Flem, Marion Le, Tanguy, Morgane, Urvoy, Stéphane, Sandt, Christophe, Dumas, Paul, Serruys, Yves

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Application of Raman spectroscopy to the study of hydrogen in an ion irradiated oxide- dispersion strengthened Fe-12 Cr steel by Brimbal, Daniel, Miro, Sandrine, de Castro, Vanessa, Poissonnet, Sylvie, Trocellier, Patrick, Serruys, Yves, Beck, Lucile

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Radiation-induced cavities in aluminium alloy imaged by in line electron holography by Ribis, Joel, Donnadieu, Patricia, Flament, Camille, Garnier, Jérôme, Lepretre, Frédéric, Serruys, Yves, Deschamps, Alexis

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Limits in point to point resolution of MOS based pixels detector arrays by Fourches, N., Desforge, D., Kebbiri, M., Kumar, V., Serruys, Y., Gutierrez, G., Leprêtre, F., Jomard, F.

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In situ E-SEM and TEM observations of the thermal annealing effects on ion-amorphized 6H-SiC single crystals and nanophased SiC fibers by Huguet-Garcia, Juan, Jankowiak, Aurelien, Miro, Sandrine, Podor, Renaud, Meslin, Estelle, Serruys, Yves, Costantini, Jean-Marc

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Patterning SiC nanoprecipitate in Si single crystals by simultaneous dual- beam ion implantation by Velişa, Gihan, Trocellier, Patrick, Thomé, Lionel, Vaubaillon, Sylvain, Sattonnay, Gaël, Miro, Sandrine, Serruys, Yves

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Investigation of irradiation effects induced by self-ion in 6H-SiC combining RBS/C, Raman and XRD by Chaâbane, N., Debelle, A., Sattonnay, G., Trocellier, P., Serruys, Y., Thomé, L., Zhang, Y., Weber, W.J., Meis, C., Gosmain, L., Boulle, A.

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Advanced SiC fiber strain behavior during ion beam irradiation by Jankowiak, A., Grygiel, C., Monnet, I., Serruys, Y., Colin, C., Miro, S., Gelebart, L., Gosmain, L., Costantini, J.-M.

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Study of Ion Irradiation Effects on Microstructure of ODS Ferritic Steels by Atom Probe Tomography by Radiguet, Bertrand, Serruys, Yves, Kalokhtina, Olena, Couvrat, Mathieu, Chaffron, Laurent, Legendre, Fabrice, Pareige, Philippe

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Radiation damage induced at the surface of titanium by argon ions of a few MeV by Do, Ngoc-Long, Bérerd, Nicolas, Moncoffre, Nathalie, Yang, Feng, Trocellier, Patrick, Serruys, Yves, Gorse-Pomonti, Dominique

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On the Stability of Nanostructured 18-Chromium ODS Steels under High Dose Ion-Irradiation by Lescoat, Marie-Laure, Ribis, Joel, Marquis, Emmanuelle, Chen, Yimeng, Gentils, Aurelie, Kantasov, Odile, Serruys, Yves, Trocellier, Patrick, Motta, Arthur, De Carlan, Yann, Legris, Alexandre

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Determination of the helium diffusion coefficient in nuclear waste storage ceramics by a nuclear reaction analysis method by Gosset, Dominique, Trocellier, Patrick, Serruys, Yves

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Advanced SiC fiber strain behavior during ion beam irradiation by Jankowiak, Aurélien, Grygiel, Clara, Monnet, Isabelle, Serruys, Yves, Colin, Christian, Miro, Sandrine, Gélébart, Lionel, Gosmain, Lionel, Costantini, Jean-Marc

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Reactive sputtering deposition of SiO2 thin films by IVAN RADOVIC, YVES SERRUYS, YVES LIMOGE, NATASA BIBIC

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Effect of displacement damage on the stability of oxide nanoparticles in model ODS alloys: TEM studies by Santra, Sumita, Balaji, S., Panigrahi, B. K., Serruys, Yves, Robertson, C., Ana, Alamo, Sundar, C. S., CEA, Saclay, Materials Science Group, Indira Gandhi Centre for Atomic Research, Kalpakkam 603 102

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Limits in point to point resolution of MOS (Metal-Oxide-Semiconductor) based pixels detector arrays by Fourches, Nicolas, Coppolani, Xavier, Desforge, Daniel, Kebbiri, Mariam, Kumar, Vishant, Serruys, Yves, Gutierrez, Gaêlle, Leprêtre, Frederic, Jomard, François

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3He thermal diffusion coefficient measurement in crystalline ceramics by μnra depth profiling by Trocellier, Patrick, Gosset, Dominique, Simeone, David, Costantini, Jean Marc, Deschanels, Xavier, Roudil, Danielle, Serruys, Yves, Grynszpan, Robert, Saudé, Sébastien, Beauvy, Michel

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Effect of He-ion irradiation on short-range ordering in model (EFDA) Fe-Cr alloys by Dubiel, Stanislaw M, Żukrowski, Jan, Serruys, Yves

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Application of nuclear reaction geometry for 3He depth profiling in nuclear ceramics by Trocellier, Patrick, Gosset, Dominique, Simeone, David, Costantini, Jean Marc, Deschanels, Xavier, Roudil, Danielle, Serruys, Yves, Grynszpan, Robert, Saudé, Sébastien, Beauvy, Michel

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