Search Results - Yabuhara, Hidehiko

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  1. 1
    Prediction of low-energy boron doping profile for ultrashallow junction formation by hybrid molecular dynamics method

    Prediction of low-energy boron doping profile for ultrashallow junction formation by hybrid molecular dynamics method by Yabuhara, Hidehiko, Miyamoto, Akira

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  2. 2
    Spectroscopic Study of TiOx Film for Novel n-type Semiconductor/insulator/p-type Semiconductor Rechargeable Device

    Spectroscopic Study of TiOx Film for Novel n-type Semiconductor/insulator/p-type Semiconductor Rechargeable Device by YABUHARA, Hidehiko, SASAKI, Akito, KATAOKA, Yoshinori, SUZUKI, Koji, ITO, Takahiro, TAKAGI, Shigeyuki, HIRABAYASHI, Hideaki

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  3. 3
    Fabrication of solid-state secondary battery using semiconductors and evaluation of its charge/discharge characteristics

    Fabrication of solid-state secondary battery using semiconductors and evaluation of its charge/discharge characteristics by Sasaki, Atsuya, Sasaki, Akito, Hirabayashi, Hideaki, Saito, Shuichi, Aoki, Katsuaki, Kataoka, Yoshinori, Suzuki, Koji, Yabuhara, Hidehiko, Ito, Takahiro, Takagi, Shigeyuki

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  4. 4
    Spectroscopic Study of TiOx Film for Novel n-type Semiconductor/insulator/p-type Semiconductor Rechargeable Device

    Spectroscopic Study of TiOx Film for Novel n-type Semiconductor/insulator/p-type Semiconductor Rechargeable Device by YABUHARA, Hidehiko, SASAKI, Akito, KATAOKA, Yoshinori, SUZUKI, Koji, ITO, Takahiro, TAKAGI, Shigeyuki, HIRABAYASHI, Hideaki

    Published in Electrochemistry
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  5. 5
    Tight-Binding Quantum Chemical Molecular Dynamics Study on Depth Profile Prediction in Low Energy Boron Implantation Process

    Tight-Binding Quantum Chemical Molecular Dynamics Study on Depth Profile Prediction in Low Energy Boron Implantation Process by Tsuboi, Hideyuki, Sagawa, Ai, Iga, Hideki, Sasata, Katsumi, Masuda, Tsuyoshi, Koyama, Michihisa, Kubo, Momoji, Broclawik, Ewa, Yabuhara, Hidehiko, Miyamoto, Akira

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  6. 6
    Evaluation of n + a-Si Contact with Indium Tin Oxide by X-Ray Photoelectron Spectroscopy Valence Band Measurement

    Evaluation of n + a-Si Contact with Indium Tin Oxide by X-Ray Photoelectron Spectroscopy Valence Band Measurement by Yabuhara, Hidehiko, Kataoka, Yoshinori

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  7. 7
    Calibration Method for High-Density-Plasma Chemical Vapor Deposition Simulation

    Calibration Method for High-Density-Plasma Chemical Vapor Deposition Simulation by Kinoshita, Shigeru, Takagi, Shigeyuki, Yabuhara, Hidehiko, Nishimura, Hiroshi, Kawaguchi, Hideichi, Shigyo, Naoyuki

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  8. 8
    Scanning capacitance microscopy measurements using diamond-coated probes

    Scanning capacitance microscopy measurements using diamond-coated probes by Yabuhara, Hidehiko, Ciappa, Mauro, Fichtner, Wolfgang

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