Search Results - Yamaguchi, T.J.

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  1. 1
    Extraction of instantaneous and RMS sinusoidal jitter using an analytic signal method

    Extraction of instantaneous and RMS sinusoidal jitter using an analytic signal method by Yamaguchi, T.J., Soma, M., Ishida, M., Watanabe, T., Ohmi, T.

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  2. 2
    Skew measurements in clock distribution circuits using an analytic signal method

    Skew measurements in clock distribution circuits using an analytic signal method by Yamaguchi, T.J., Soma, M., Nissen, J.P., Halter, D.E., Raina, R., Ishida, M.

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  3. 3
    Novel CMOS Circuits to Measure Data-Dependent Jitter, Random Jitter, and Sinusoidal Jitter in Real Time

    Novel CMOS Circuits to Measure Data-Dependent Jitter, Random Jitter, and Sinusoidal Jitter in Real Time by Ichiyama, K., Ishida, M., Yamaguchi, T.J., Soma, M.

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  4. 4
    A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing

    A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing by Yamaguchi, T.J., Kawabata, M., Soma, M., Ishida, M., Sawami, K., Uekusa, K.

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  5. 5
    A programmable on-chip picosecond jitter-measurement circuit without a reference-clock input

    A programmable on-chip picosecond jitter-measurement circuit without a reference-clock input by Ishida, M., Ichiyama, K., Yamaguchi, T.J., Soma, M., Suda, M., Okayasu, T., Watanabe, D., Yamamoto, K.

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  6. 6
    A method for compressing test data based on Burrows-Wheeler transformation

    A method for compressing test data based on Burrows-Wheeler transformation by Yamaguchi, T.J., Dong Sam Ha, Ishida, M., Ohmi, T.

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  7. 7
    Top 5 Issues in Practical Testing of High-Speed Interface Devices

    Top 5 Issues in Practical Testing of High-Speed Interface Devices by Yamaguchi, T.J.

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  8. 8
    A new approach to built-in self-testable datapath synthesis based on integer linear programming

    A new approach to built-in self-testable datapath synthesis based on integer linear programming by Han Bin Kim, Dong Sam Ha, Takahashi, T., Yamaguchi, T.J.

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  9. 9
    A method for measuring the cycle-to-cycle period jitter of high-frequency clock signals

    A method for measuring the cycle-to-cycle period jitter of high-frequency clock signals by Yamaguchi, T.J., Soma, M., Halter, D., Raina, R., Nissen, J., Ishida, M.

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  10. 10
    Open architecture ate and 250 consecutive uls

    Open architecture ate and 250 consecutive uls by Yamaguchi, T.J.

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  11. 11
    Total Jitter Measurement for Testing HSIO Integrated SoCs

    Total Jitter Measurement for Testing HSIO Integrated SoCs by Yamaguchi, T.J., Ishida, M.

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  12. 12
    A robust method for identifying a deterministic jitter model in a total jitter distribution

    A robust method for identifying a deterministic jitter model in a total jitter distribution by Yamaguchi, T.J., Ichiyama, K., Hou, H.X., Ishida, M.

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  13. 13
    Phase-based alignment of two signals having partially overlapped spectra

    Phase-based alignment of two signals having partially overlapped spectra by Tumewu, A., Miyazawa, K., Aoki, T., Yamaguchi, T.J., Degawa, K., Akita, T.

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  14. 14
    An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time

    An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time by Yamaguchi, T.J., Hou, H.X., Takayama, K., Armstrong, D., Ishida, M., Soma, M.

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  15. 15
    Data jitter measurement using a delta-time-to-voltage converter method

    Data jitter measurement using a delta-time-to-voltage converter method by Ichiyama, K., Ishida, M., Yamaguchi, T.J., Soma, M.

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  16. 16
    Loopback or not? (loopback testing)

    Loopback or not? (loopback testing) by Yamaguchi, T.J.

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  17. 17
    On-Chip Circuit for Measuring Data Jitter in the Time or Frequency Domain

    On-Chip Circuit for Measuring Data Jitter in the Time or Frequency Domain by Ishida, M., Ichiyama, K., Yamaguchi, T.J., Soma, M., Suda, M., Okayasu, T.

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  18. 18
    A Real-Time Delta-Time-to-Voltage Converter for Clock Jitter Measurement

    A Real-Time Delta-Time-to-Voltage Converter for Clock Jitter Measurement by Ichiyama, K., Ishida, M., Yamaguchi, T.J., Soma, M.

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  19. 19
    Mismatch-Tolerant Circuit for On-Chip Measurements of Data Jitter

    Mismatch-Tolerant Circuit for On-Chip Measurements of Data Jitter by Ichiyama, K., Ishida, M., Yamaguchi, T.J., Soma, M.

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  20. 20
    A Study of Per-Pin Timing Jitter Scope

    A Study of Per-Pin Timing Jitter Scope by Yamaguchi, T.J., Iwamoto, S., Ishida, M., Soma, M.

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