Search Results - Yao, Huade Walter

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    A Realistic Method for Time-Dependent Dielectric Breakdown Reliability Analysis for Advanced Technology Node

    A Realistic Method for Time-Dependent Dielectric Breakdown Reliability Analysis for Advanced Technology Node by Kong Boon Yeap, Fen Chen, Yao, Huade Walter, Tian Shen, Sing Fui Yap, Justison, Patrick

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    Pulsed laser annealing of GaAs implanted with Se and Si

    Pulsed laser annealing of GaAs implanted with Se and Si by Rys, Andrew, Compaan, Alvin D, Bhat, Ajit, Yao, H. Walter, Shieh, Yanan

    Published in Optical Engineering
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