Search Results - Yashanin, I.B.

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    The radiation test based assessment of process quality and reliability for conventional 65-nm CMOS technology

    The radiation test based assessment of process quality and reliability for conventional 65-nm CMOS technology by Kessarinskiy, L.N., Davydov, G.G., Boychenko, D.V., Artamonov, A.S., Nikiforov, A.Y., Yashanin, I.B.

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