Search Results - Yashiro, Takehisa

  • Showing 1 - 8 results of 8
Refine Results
  1. 1
    Oxidized Porous Silicon-Silicon Interface Investigation by C-V Method

    Oxidized Porous Silicon-Silicon Interface Investigation by C-V Method by Imai, Kazuo, Yashiro, Takehisa

    Get full text
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    Preparation of the Tetragonal Germanium Dioxide for the Passivation of Germanium Devices

    Preparation of the Tetragonal Germanium Dioxide for the Passivation of Germanium Devices by Yashiro, Takehisa, Igarashi, Yoshitaka, Niimi, Tatsuya, Takeuchi, Satoshi

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  3. 3
    Some Properties of Vapor Deposited Ge[sub 3]N[sub 4], Films and the Ge[sub 3]N[sub 4]-Ge Interface

    Some Properties of Vapor Deposited Ge[sub 3]N[sub 4], Films and the Ge[sub 3]N[sub 4]-Ge Interface by Yashiro, Takehisa

    Get full text
    Items that cite this one
    Article
    Save to List
    Saved in:
  4. 4
    Determination of Trap Levels in Ge 3 N 4 and Barrier Energies at the Ge 3 N 4 -Ge Interface by C-V Characteristics

    Determination of Trap Levels in Ge 3 N 4 and Barrier Energies at the Ge 3 N 4 -Ge Interface by C-V Characteristics by Yashiro, Takehisa

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  5. 5
    Frequency and Temperature Dependence of C-V Characteristics at Ge-SiO 2 Interface and BT Treatments

    Frequency and Temperature Dependence of C-V Characteristics at Ge-SiO 2 Interface and BT Treatments by Yashiro, Takehisa

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  6. 6
    Surface State Formation during Long-Term Bias-Temperature Stress Aging of Thin SiO 2 –Si Interfaces

    Surface State Formation during Long-Term Bias-Temperature Stress Aging of Thin SiO 2 –Si Interfaces by Shiono, Noboru, Yashiro, Takehisa

    Get full text
    Items that cite this one
    Article
    Save to List
    Saved in:
  7. 7
    Properties of MNMOS Structure Interposing Platinum at Si 3 N 4 –SiO 2 Interface

    Properties of MNMOS Structure Interposing Platinum at Si 3 N 4 –SiO 2 Interface by Yoshino, Hideo, Kiuchi, Kazuhide, Yashiro, Takehisa

    Get full text
    Items that cite this one
    Article
    Save to List
    Saved in:
  8. 8
    Effect of Platinum Particles in Dual SiO 2 Interface on Charge Storage Properties

    Effect of Platinum Particles in Dual SiO 2 Interface on Charge Storage Properties by Yoshino, Hideo, Kiuchi, Kazuhide, Yashiro, Takehisa

    Get full text
    Items that cite this one
    Article
    Save to List
    Saved in:

Search Tools: