LEO spacecraft leakage current and discharging phenomena: TRW LDEF SP-HVDE (space plasma-high voltage drainage experiment) by Yaung, J.Y., Wong, W.C., Blakkolb, B.K., Ryan, L.E., Taylor, W.W.L.

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Narrow width effects of bottom-gate polysilicon thin film transistors by Yaung, D.N., Fang, Y.K., Hwang, K.C., Lee, K.Y., Wu, K.H., Ho, J.J., Chen, C.Y., Wang, Y.J., Liang, M.S., Lee, J.Y., Wuu, S.G.

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