On the Evolution From Micrometer-Scale Inhomogeneity to Global Overheated Structure During the Intense Joule Heating of a z-Pinch Rod by Awe, T. J., Yu, E. P., Yates, K. C., Yelton, W. G., Bauer, B. S., Hutchinson, T. M., Fuelling, S., Mckenzie, B. B.

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Nanoporous Carbon Films for Gas Microsensors by Siegal, M. P, Yelton, W. G, Overmyer, D. L, Provencio, P. P

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Dissociated \[ \frac{1}{3}\langle 0\bar{1}11\rangle \] dislocations in Bi2Te3 and their relationship to seven-layer Bi3Te4 defects by Medlin, D L, Erickson, K J, Limmer, S J, Yelton, W G, Siegal, M P

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Experimental observation of the stratified electrothermal instability on aluminum with thickness greater than a skin depth by Hutchinson, T M, Awe, T J, Bauer, B S, Yates, K C, Yu, E P, Yelton, W G, Fuelling, S

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Porous Al2O3 nanogeometry sensor films: Growth and analysis by YELTON, W. G, PFEIFER, K. B, STATON, A. W

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Nanoporous-carbon films for microsensor preconcentrators by Siegal, M. P., Overmyer, D. L., Kottenstette, R. J., Tallant, D. R., Yelton, W. G.

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TEM Analyses of Bismuth-Antimony Thermoelectric Nanowires by Hekmaty, M.A., Lensch-Falk, J.L., Medlin, D.L., Yelton, W.G., Limmer, S.J., Siegal, M.P.

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Differentiation of Chemical Components in a Binary Solvent Vapor Mixture Using Carbon/Polymer Composite-Based Chemiresistors by Patel, Sanjay V, Jenkins, Mark W, Hughes, Robert C, Yelton, W. Graham, Ricco, Antonio J

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Characteristics and mechanisms in ion-conducting polymer films as chemical sensors: Polyethyleneoxide by HUGHES, R. C, YELTON, W. G, PFEIFER, K. B, PATEL, S. V

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Use of classical least squares/partial least squares (CLS/PLS) hybrid algorithm for calibration and calibration maintenance of surface acoustic wave (SAW) devices by Rivera, D., Alam, M.K., Yelton, W.G., Staton, A.W., Simonson, R.J.

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Dissociated $$ \frac{1}{3}\langle 0\bar{1}11\rangle $$ 1 3 〈 0 1 ¯ 11 〉 dislocations in Bi2Te3 and their relationship to seven-layer Bi3Te4 defects by Medlin, D. L., Erickson, K. J., Limmer, S. J., Yelton, W. G., Siegal, M. P.

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Dissociated $ \frac{1}{3}\langle 0\bar{1}11\rangle $ dislocations in Bi sub(2)Te sub(3) and their relationship to seven-layer Bi sub(3)Te sub(4) defects by Medlin, D L, Erickson, K J, Limmer, S J, Yelton, W G, Siegal, M P

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Dissociated 13〈01¯11〉 dislocations in Bi2Te3 and their relationship to seven-layer Bi3Te4 defects by Medlin, D. L., Erickson, K. J., Limmer, S. J., Yelton, W. G., Siegal, M. P.

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Core Structure of Dissociated Dislocations in Bi2Te3 Nanowires by Medlin, D.L., Erickson, K.J., Limmer, S.J., Yelton, W.G., Siegal, M.P.

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An Electron Microscopic Investigation of (1/3) < 0ī11 > Dislocations in Bi2Te3 Nanowires: Defect Crystallography and Relationship to 7-layer Bi3Te4 Defects by Medlin, D.L., Erickson, K.J., Limmer, S.J., Yelton, W.G., Siegal, M.P.

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Dispersion Relation of Stratified Electrothermal Instability in Warm, Dense, Tamped Aluminum-6061 with Current in a Skin Layer by Bauer, B.S., Hutchinson, T.M., Fuelling, S., Awe, T.J., Yu, E.P., Yelton, W.G., Yates, K.C.

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Two-Dimensional Péclet Numbers for Peak Quality Scoring by Pfeifer, K. B., Yelton, W. G., Kerr, D. R.

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Micro-analytical systems for national security applications by Cernosek, R. W, Robinson, A. L, Cruz, D. Y, Adkins, D. R, Barnett, J. L, Bauer, J. M, Blain, M. G, Byrnes, J. E, Dirk, S. M, Dulleck, G. R, Ellison, J. A, Fleming, J. G, Hamilton, T. W, Heller, E. J, Howell, S. W, Kottenstette, R. J, Lewis, P. R, Manginell, R. P, Moorman, M. W, Mowry, C. D, Manley, R. G, Okandan, M, Rahimian, K, Shelmidine, G. J, Shul, R. J, Simonson, R. J, Sokolowski, S. S, Spates, J. J, Staton, A. W, Trudell, D. E, Wheeler, D. R, Yelton, W. G

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Size Effects in Ni/Ni(OH) 2 Nanomaterials for Electrochemical Capacitors by Limmer, Steven J., Yelton, W. Graham, Bunker, Bruce C.

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Nanoporous Carbon for Electrochemical Capacitors by Limmer, Steven J., Yelton, W. Graham, Siegal, Michael, Bunker, Bruce C.

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