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SRAM Redundancy - Silicon Area versus Number of Repairs Trade-off
by
Bickford, J.P.
,
Rosner, R.
,
Hedberg, E.
,
Yoder, J.W.
,
Barnett, T.S.
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Power, Performance, and Area Optimization Through the Use of Semiconductor Trench Decoupling Capacitors
by
Garofano, U.
,
Yoder, J.W.
,
Bickford, J.P.
,
Ng, C.S.
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Wafer-scale optimization using computational availability
by
Landis, D.L.
,
Nigam, N.
,
Yoder, J.W.
Published in
Computer (Long Beach, Calif.)
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SMAC: A scene matching chip
by
Ranganathan, N.
,
Sastry, R.
,
Venkatesan, R.
,
Yoder, J.W.
,
Keezer, D.
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First Principles Study of Collector Transit Time Modulation in Double Heterojunction Bipolar Transistors
by
Sculley, Jonathan P.
,
Fang, Yihao
,
Markman, Brian
,
Urteaga, Miguel E.
,
Carter, Andy D.
,
Rodwell, Mark J. W.
,
Yoder, Paul D.
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Status of NRC approval of EPRI electromagnetic interference susceptibility testing guidelines for digital equipment
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James, R.W.
,
Shank, J.W.
,
Yoder, C.
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