Search Results - Yoo, Ilho

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  1. 1
    The Fiscal Burden of Korean Reunification: A Generational Accounting Approach

    The Fiscal Burden of Korean Reunification: A Generational Accounting Approach by Auerbach, Alan J., Chun, Young Jun, Yoo, Ilho

    Published in Finanzarchiv
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  2. 2
    The Fiscal Burden of Korean Reunification: A Generational Accounting Approach

    The Fiscal Burden of Korean Reunification: A Generational Accounting Approach by Auerbach, Alan J, Young, Jun Chun, Yoo, Ilho

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  3. 3
    A Comprehensive Study of Read-After-Write-Delay for Ferroelectric VNAND

    A Comprehensive Study of Read-After-Write-Delay for Ferroelectric VNAND by Myeong, Ilho, Lim, Suhwan, Kim, Taeyoung, Park, Sanghyun, Noh, Suseong, Lee, Seung Min, Woo, Jongho, Ko, Hanseung, Noh, Youngji, Choi, Munkang, Lee, Kiheun, Han, Sangwoo, Baek, Jongyeon, Kim, Kijoon, Jung, Dongjin, Kim, Jisung, Park, Jaewoo, Kim, Seunghyun, Kim, Hyoseok, Yoon, Ilyounz, Kim, Jaeho, Kim, Kwangsoo, Park, Kwangmin, Kuh, Bong Jin, Kim, Wanki, Ha, Daewon, Ahn, Sujin, Song, Jaihyuk, Yoo, Sijung, Lee, Hyun Jae, Choe, Duk-Hyun, Nam, Seung-Geol, Heo, Jinseong

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  4. 4
    Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET

    Drain Current Degradation Induced by Charge Trapping/De-Trapping in Fe-FET by Kim, Taeyoung, Lim, Suhwan, Myeong, Ilho, Park, Sanghyun, Noh, Suseong, Lee, Seung Min, Woo, Jongho, Ko, Hanseung, Noh, Youngji, Choi, Moonkang, Lee, Kiheun, Han, Sangwoo, Baek, Jongyeon, Kim, Kijoon, Jung, Dongjin, Kim, Ji-sung, Park, Jaewoo, Kim, Seunghyun, Kim, Hyoseok, Yoo, Sijung, Lee, Hyun Jae, Choe, Duk-Hyun, Nam, Seung-Geol, Yoon, Ilyoung, Kim, Chaeho, Kim, Kwanzsoo, Park, Kwanzmin, Kuh, Bong Jin, Heo, Jinseong, Kim, Wanki, Ha, Daewon, Song, Jaihyuk

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  5. 5
    Macelignan attenuates LPS-induced inflammation and reduces LPS-induced spatial learning impairments in rats

    Macelignan attenuates LPS-induced inflammation and reduces LPS-induced spatial learning impairments in rats by Cui, Chun-Ai, Jin, Da-Qing, Hwang, Yoo Kyeong, Lee, Im-Soon, Hwang, Jae Kwan, Ha, Ilho, Han, Jung-Soo

    Published in Neuroscience letters
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  6. 6
    Comprehensive Design Guidelines of Gate Stack for QLC and Highly Reliable Ferroelectric VNAND

    Comprehensive Design Guidelines of Gate Stack for QLC and Highly Reliable Ferroelectric VNAND by Lim, Suhwan, Kim, Taeyoung, Myeong, Ilho, Park, Sanghyun, Noh, Suseong, Lee, Seung Min, Woo, Jongho, Ko, Hanseung, Noh, Youngji, Choi, Moonkang, Lee, Kiheun, Han, Sangwoo, Baek, Jongyeon, Kim, Kijoon, Kim, Juhyung, Jung, Dongjin, Kim, Kwangsoo, Yoo, Sijung, Lee, Hyun Jae, Nam, Seung-Geol, Kim, Ji-Sung, Park, Jaewoo, Kim, Chaeho, Kim, Seunghyun, Kim, Hyoseok, Heo, Jinseong, Park, Kwangmin, Jeon, Sanghun, Kim, Wanki, Ha, Daewon, Shin, Yu Gyun, Song, Jaihyuk

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  7. 7
    Studies on the Thermal Cycling Reliability of Fine Pitch Cu/SnAg Double-Bump Flip Chip Assemblies on Organic Substrates: Experimental Results and Numerical Analysis

    Studies on the Thermal Cycling Reliability of Fine Pitch Cu/SnAg Double-Bump Flip Chip Assemblies on Organic Substrates: Experimental Results and Numerical Analysis by Ho-Young Son, Kyung-Wook Paik, Ilho Kim, Jin-Hyoung Park, Soon-Bok Lee, Gi-Jo Jung, Byung-Jin Park, Kwang-Yoo Byun

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