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Investigation of asymmetric degradation in electrical properties of a-InGaZnO thin-film transistor arrays as a function of channel width-to-length aspect ratio
by
Agrawal, Khushabu
,
Patil, Vilas
,
Chavan, G. T.
,
Yoon, Geonju
,
Kim, Jaemin
,
Park, Jinsu
,
Pae, Sangwoo
,
Kim, JinSeok
,
Cho, Eun-Chel
,
Yi, Junsin
Published in
Journal of materials science. Materials in electronics
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Effect of IGZO thin films fabricated by Pulsed-DC and RF sputtering on TFT characteristics
by
Kim, Jaemin
,
Park, Jinsu
,
Yoon, Geonju
,
Khushabu, Agrawal
,
Kim, Jin-Seok
,
Pae, Sangwoo
,
Cho, Eun-Chel
,
Yi, Junsin
Published in
Materials science in semiconductor processing
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Temperature-dependent study of slow traps generation mechanism in HfO2/GeON/Ge(1 1 0) metal oxide semiconductor devices
by
Agrawal, Khushabu
,
Patil, Vilas
,
Barhate, Viral
,
Yoon, Geonju
,
Lee, Youn-Jung
,
Mahajan, Ashok
,
Yi, Junsin
Published in
Solid-state electronics
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Optimization of MIS type Non-Volatile Memory Device with Al-Doped HfO2 as Charge Trapping Layer
by
Yoon, Geonju
,
Kim, Taeyong
,
Agrawal, Khushabu
,
Kim, Jaemin
,
Park, Jinsu
,
Kim, Hyun-Hoo
,
Cho, Eun-Chel
,
Yi, Junsin
Published in
ECS journal of solid state science and technology
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Optimization of MIS type Non-Volatile Memory Device with Al-Doped HfO 2 as Charge Trapping Layer
by
Yoon, Geonju
,
Kim, Taeyong
,
Agrawal, Khushabu
,
Kim, Jaemin
,
Park, Jinsu
,
Kim, Hyun-Hoo
,
Cho, Eun-Chel
,
Yi, Junsin
Published in
ECS journal of solid state science and technology
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Improving Retention Properties of ALD-Al x O y Charge Trapping Layer for Non-Volatile Memory Application
by
Agrawal, Khushabu
,
Yoon, Geonju
,
Kim, Jeongsoo
,
Chavan, Ganesh
,
Kim, Jaemin
,
Park, Jinsu
,
Phong, Pham Duy
,
Cho, Eun-Chel
,
Yi, Junsin
Published in
ECS journal of solid state science and technology
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Improving Retention Properties of ALD-AlxOy Charge Trapping Layer for Non-Volatile Memory Application
by
Agrawal, Khushabu
,
Yoon, Geonju
,
Kim, Jeongsoo
,
Chavan, Ganesh
,
Kim, Jaemin
,
Park, Jinsu
,
Phong, Pham Duy
,
Cho, Eun-Chel
,
Yi, Junsin
Published in
ECS journal of solid state science and technology
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Ecs Journal Of Solid State Science And Technology
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Backfile Package - Engineering And Technology [Yen]
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