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    First Measurement of the Nuclear-Recoil Ionization Yield in Silicon at 100 eV by Albakry, M.  F., Alkhatib, I., Alonso, D., Amaral, D.  W. P., Aralis, T., Azadbakht, E., Banik, S., Bathurst, C., Bhattacharyya, R., Brink, P.  L., Bunker, R., Cabrera, B., Calkins, R., Cameron, R.  A., Cartaro, C., Cerdeño, D.  G., Chang, Y. -Y., Chaudhuri, M., Chott, N., Coombes, H., Corbett, J., Das, S., De Brienne, F., Rios, M., Dharani, S., di Vacri, M.  L., Diamond, M.  D., Figueroa-Feliciano, E., Fink, C.  W., Fouts, K., Fritts, M., Germond, R., Golwala, S.  R., Hines, B.  A., Hong, Z., Hoppe, E.  W., Huber, M.  E., Iyer, V., Kurinsky, N.  A., Litke, M., Liu, J., Loer, B., Lopez Asamar, E., Lukens, P., MacFarlane, D.  B., Meyer zu Theenhausen, H., Michaud, É., Michielin, E., Mirabolfathi, N., Mohanty, B., Nebolsky, B., Nelson, J., Neog, H., Novati, V., Osborne, M.  D., Oser, S.  M., Page, W.  A., Pandey, L., Pandey, S., Partridge, R., Perna, L., Podviianiuk, R., Ponce, F., Pradeep, A., Pyle, M., Reid, E., Ren, R., Tanner, E., Robinson, A.  E., Saab, T., Sadek, D., Sadoulet, B., Sahoo, S.  P., Schmidt, B., Scorza, S., Serfass, B., Sinervo, P., Speaks, Z., Street, J., Terry, G.  D., Thasrawala, F.  K., Verma, S., von Krosigk, B., Watkins, S.  L., Winchell, J., Wykoff, K., Yellin, S., Young, B.  A., Yu, T.  C., Zatschler, B., Zaytsev, A., Zeolla, A., Zhang, E., Zheng, Y., Zuniga, A., An, P., Barbeau, P.  S., Hedges, S.  C., Li, L., Runge, J.

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