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Retention Mechanism of Localized Silicon–Oxide–Nitride–Oxide–Silicon Embedded NOR Device
by
Hyun, JaeWoong
,
Jeong, YounSeok
,
Chae, HeeSoon
,
Seo, Sunae
,
Kim, JinHee
,
Um, MyungYoon
,
Lee, ByoungJin
,
Kim, KiChul
,
Cho, InWook
,
Bae, GeumJong
,
Lee, NaeIn
,
Kim, ChungWoo
Published in
Japanese Journal of Applied Physics
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70 nm Silicon-Oxide-Nitride-Oxide-Silicon Nonvolatile Memory Devices Using Fowler-Nordheim Programming and Hot Hole Erase Method
by
Chae, Soodoo
,
Lee, Changju
,
Kim, Juhyung
,
Sung, Sukkang
,
Sim, Jaeseong
,
Kim, Moonkyung
,
Yoon, Sewook
,
Jeong, Younseok
,
Ryu, Wonil
,
Kim, Taehun
,
Park, Byung-Gook
,
Lee, Jo-won
,
Kim, Chungwoo
Published in
Japanese Journal of Applied Physics
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New phenomena for the Lifetime Prediction of TANOS-based Charge Trap NAND Flash Memory
by
Juhyung Kim
,
Changseok Kang
,
Sung-Il Chang
,
Jongyeon Kim
,
Younseok Jeong
,
Chan Park
,
Joo-Heon Kang
,
Sang-Hoon Kim
,
Sunkyu Hwang
,
Byeong-In Choe
,
Jintaek Park
,
Juhyuck Chung
,
Youngwoo Park
,
Jungdal Choi
,
Chilhee Chung
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Self Aligned Trap-Shallow Trench Isolation Scheme for the Reliability of TANOS (TaN/AlO/SiN/Oxide/Si) NAND Flash Memory
by
Jae Sung Sim
,
Jintaek Park
,
Changseok Kang
,
Wonseok Jung
,
Yoocheol Shin
,
Juhyung Kim
,
Jongsun Sel
,
Changhyun Lee
,
Sanghun Jeon
,
Younseok Jeong
,
Youngwoo Park
,
Jungdal Choi
,
Won-Seong Lee
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Comparative feasibility study of combined cycles for marine power system in a large container ship considering energy efficiency design index (EEDI)
by
Ahn, Junkeon
,
Lee, Sanghyuk
,
Jeong, Jinyeong
,
Choi, Younseok
Published in
International journal of hydrogen energy
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