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Issues in fatigue life prediction model for underfilled flip chip bump
by
Islam, N.
,
Syed, A.
,
TaeKyeong Hwang
,
YunHyeon Ka
,
WonJoon Kang
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TIM selection methodology for high power flip chip packages
by
Islam, Nokibul
,
SeoWon Lee
,
JoonYeob Lee
,
YunHyeon Ka
,
JinYoung Khim
,
Galloway, Jesse
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Mechanical, thermal and electrical analysis of a compliant interconnect
by
Galloway, J.
,
Syed, A.
,
WonJoon Kang
,
Jin Young Khim
,
Cannis, J.
,
YunHyeon Ka
,
Seungmo Kim
,
TaeSeong Kim
,
GiSong Lee
,
SangHyun Ryu
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Conference Proceedings
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Engineering
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Delamination
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Design. Technologies. Operation Analysis. Testing
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Electric Resistance
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Electric Shock
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Electrical Resistance Measurement
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Electronic Equipment And Fabrication. Passive Components, Printed Wiring Boards, Connectics
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Engineering, Mechanical
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Ieee Electronic Library (Iel) Conference Proceedings
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