Search Results - Yunzhan Gong

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  1. 21
    Path-Sensitive Oracle Data Selection via Static Analysis

    Path-Sensitive Oracle Data Selection via Static Analysis by Zhang, Mingzhe, Gong, Yunzhan, Wang, Yawen, Jin, Dahai

    Published in Electronics (Basel)
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  2. 22
    False positive elimination in suspected code fault automatic confirmation

    False positive elimination in suspected code fault automatic confirmation by Zhu, Honglei, Jin, Dahai, Gong, Yunzhan

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  3. 23
    Test input generation of bitwise operation based on four-valued logic

    Test input generation of bitwise operation based on four-valued logic by Li, Feng, Wang, Yawen, Gong, Yunzhan

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  4. 24
    Statistical testing data generation for UAS

    Statistical testing data generation for UAS by Sui, Jianwei, Gong, Yunzhan, Jin, Dahai, Wang, Yawen

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  5. 25
    An efficient method of logical expression constraint solving in path-oriented unit test

    An efficient method of logical expression constraint solving in path-oriented unit test by Wang, Yalan, Liu, Songyi, Wang, Yawen, Gong, Yunzhan

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  6. 26
    Poster: Subsuming Mutation Operators

    Poster: Subsuming Mutation Operators by Lin, Huan, Wang, Yawen, Gong, Yunzhan

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  7. 27
    An Efficient Code-defect Testing Distributed System

    An Efficient Code-defect Testing Distributed System by Zhou, Mingnan, Jin, Dahai, Liu, Songyi, Gong, Yunzhan

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  8. 28
    Out-of-Bounds Array Access Fault Model and Automatic Testing Method Study

    Out-of-Bounds Array Access Fault Model and Automatic Testing Method Study by Gao, Chuanping, Duan, Miyi, Tan, Liqun, Gong, Yunzhan

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  9. 29
    Coverage Hole Recovery Algorithm Based on Molecule Model in Heterogeneous WSNs

    Coverage Hole Recovery Algorithm Based on Molecule Model in Heterogeneous WSNs by Song, Xiaoli, Gong, Yunzhan, Jin, Dahai, Li, Qiangyi, Hengchang Jing

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  10. 30
    An Intelligent Method Based on State Space Search for Automatic Test Case Generation

    An Intelligent Method Based on State Space Search for Automatic Test Case Generation by Xing, Ying, Huang, Junfei, Gong, Yunzhan, Wang, Yawen, Zhang, Xuzhou

    Published in Journal of software
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  11. 31
    Detecting Null-dereference Bugs via a Backward Analysis

    Detecting Null-dereference Bugs via a Backward Analysis by Wang, Qian, Jin, Dahai, Gong, Yunzhan, Zhou, Hongbo

    Published in Journal of software
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  12. 32
    A low power BIST TPG design

    A low power BIST TPG design by He Ronghui, Li Xiaowei, Gong Yunzhan

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  13. 33
    An Approach to Fully Recognizing Addressable Expression

    An Approach to Fully Recognizing Addressable Expression by Yukun Dong, Ying Xing, Dahai Jin, Yunzhan Gong, Kai Liu

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  14. 34
    Static Testing as a Service on Cloud

    Static Testing as a Service on Cloud by Siqin Chen, Junfei Huang, Yunzhan Gong

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  15. 35
    Context-Sensitive Interprocedural Defect Detection Based on a Unified Symbolic Procedure Summary Model

    Context-Sensitive Interprocedural Defect Detection Based on a Unified Symbolic Procedure Summary Model by Yunshan Zhao, Yunzhan Gong, Li Liu, Qing Xiao, Zhaohong Yang

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  16. 36
    Automatically mining similar warnings and warning combinations

    Automatically mining similar warnings and warning combinations by Dalin Zhang, Dahai Jin, Ying Xing, Hailong Zhang, Yunzhan Gong

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  17. 37
    A State Machine for Detecting C/C++ Memory Faults

    A State Machine for Detecting C/C++ Memory Faults by Guangyan Huang, Guangmei Zhang, Xiaowei Li, Yunzhan Gong

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  18. 38
    An EMF activity tree based BPEL defect pattern testing method

    An EMF activity tree based BPEL defect pattern testing method by Junfei Huang, Yunzhan Gong

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  19. 39
    Automatically Mining High Level Patterns of Software Faults within Methods

    Automatically Mining High Level Patterns of Software Faults within Methods by Hailong Zhang, Dalin Zhang, Dahai Jin, Yunzhan Gong, Chengcheng Wang

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  20. 40
    An expression's single fault model and the testing methods

    An expression's single fault model and the testing methods by Yunzhan Gong, Wanli Xu, Xiaowei Li

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