Search Results - Zakhtser, Alter

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  1. 1
    High-Quality SiO2/O-Terminated Diamond Interface: Band-Gap, Band-Offset and Interfacial Chemistry

    High-Quality SiO2/O-Terminated Diamond Interface: Band-Gap, Band-Offset and Interfacial Chemistry by Cañas, Jesús, Reyes, Daniel F., Zakhtser, Alter, Dussarrat, Christian, Teramoto, Takashi, Gutiérrez, Marina, Gheeraert, Etienne

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  2. 2
    Chemical Evolution of Pt–Zn Nanoalloys Dressed in Oleylamine

    Chemical Evolution of Pt–Zn Nanoalloys Dressed in Oleylamine by Zakhtser, Alter, Naitabdi, Ahmed, Benbalagh, Rabah, Rochet, François, Salzemann, Caroline, Petit, Christophe, Giorgio, Suzanne

    Published in ACS nano
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  3. 3
    Chemical Evolution of Pt–Zn Nanoalloys Dressed in Oleylamine

    Chemical Evolution of Pt–Zn Nanoalloys Dressed in Oleylamine by Zakhtser, Alter, Naitabdi, Ahmed, Benbalagh, Rabah, Rochet, François, Salzemann, Caroline, Petit, Christophe, Giorgio, Suzanne

    Published in ACS nano
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  4. 4
    Operando Near-Ambient Pressure X‑ray Photoelectron Spectroscopy Study of the CO Oxidation Reaction on the Oxide/Metal Model Catalyst ZnO/Pt(111)

    Operando Near-Ambient Pressure X‑ray Photoelectron Spectroscopy Study of the CO Oxidation Reaction on the Oxide/Metal Model Catalyst ZnO/Pt(111) by Liu, Hang, Zakhtser, Alter, Naitabdi, Ahmed, Rochet, François, Bournel, Fabrice, Salzemann, Caroline, Petit, Christophe, Gallet, Jean-Jacques, Jie, Wanqi

    Published in ACS catalysis
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  5. 5
    Hybridization of ellipsometry and Xps energy loss: robust band gap and broadband optical constants determination of SiGe, HfON and MoOx thin films

    Hybridization of ellipsometry and Xps energy loss: robust band gap and broadband optical constants determination of SiGe, HfON and MoOx thin films by Levert, Théo, Zakhtser, Alter, Duval, Julien, Raguenez, Chloé, Verdier, Stéphane, Le Cunff, Delphine, Tortai, Jean-Hervé, Pelissier, Bernard

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  6. 6
    Hybridization of ellipsometry and XPS energy loss: Robust band gap and broadband optical constants determination of SiGe, HfON and MoOx thin films

    Hybridization of ellipsometry and XPS energy loss: Robust band gap and broadband optical constants determination of SiGe, HfON and MoOx thin films by Levert, Théo, Zakhtser, Alter, Duval, Julien, Raguenez, Chloé, Verdier, Stéphane, Le Cunff, Delphine, Tortai, Jean-Hervé, Pelissier, Bernard

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  7. 7
    Operando Near-Ambient Pressure X-ray Photoelectron Spectroscopy Study of the CO Oxidation Reaction on the Oxide/Metal Model Catalyst ZnO/Pt(111)

    Operando Near-Ambient Pressure X-ray Photoelectron Spectroscopy Study of the CO Oxidation Reaction on the Oxide/Metal Model Catalyst ZnO/Pt(111) by Liu, Hang, Zakhtser, Alter, Naitabdi, Ahmed, Rochet, François, Bournel, Fabrice, Salzemann, Caroline, Petit, Christophe, Gallet, Jean-Jacques, Jie, Wanqi

    Published in ACS catalysis
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  8. 8
    High-Quality SiO 2 /O-Terminated Diamond Interface: Band-Gap, Band-Offset and Interfacial Chemistry

    High-Quality SiO 2 /O-Terminated Diamond Interface: Band-Gap, Band-Offset and Interfacial Chemistry by Cañas, Jesús, Reyes, Daniel F, Zakhtser, Alter, Dussarrat, Christian, Teramoto, Takashi, Gutiérrez, Marina, Gheeraert, Etienne

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  9. 9
    High-Quality ISiO/I[sub.2]/O-Terminated Diamond Interface: Band-Gap, Band-Offset and Interfacial Chemistry

    High-Quality ISiO/I[sub.2]/O-Terminated Diamond Interface: Band-Gap, Band-Offset and Interfacial Chemistry by Cañas, Jesús, Reyes, Daniel F, Zakhtser, Alter, Dussarrat, Christian, Teramoto, Takashi, Gutiérrez, Marina, Gheeraert, Etienne

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