Modeling the I-V Curves and Its Derivatives of Microwave Transistors Using Neural Networks by Zarate-de Landa, Andrés, Roblin, P., Reynoso-Hernandez, J. A., Loo-Yau, J. R.

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Vector Network Analyzer Calibration Using a Line and Two Offset Reflecting Loads by Pulido-Gaytan, M. A., Reynoso-Hernandez, J. A., Zarate-de Landa, A., Loo-Yau, J. R., del Carmen Maya-Sanchez, M.

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Artificial Neural Network Model of SOS-MOSFETs Based on Dynamic Large-Signal Measurements by Youngseo Ko, Roblin, Patrick, Zarate-de Landa, Andres, Apolinar Reynoso-Hernandez, J., Nobbe, Dan, Olson, Chris, Martinez, Francisco Javier

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Generalized Theory of the Thru-Reflect-Match Calibration Technique by Pulido-Gaytan, Manuel Alejandro, Apolinar Reynoso-Hernandez, J., Loo-Yau, Jose Raul, Zarate-de Landa, Andres, Maya-Sanchez, Maria del Carmen

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A new method for determining the gate resistance and inductance of GaN HEMTs based on the extrema points of Z11 curves by Reynoso-Hernandez, J.A., Zuniga-Juarez, J.E., Zarate-de Landa, Andres

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A neural network approach to smooth calibrated data corrupted from switching errors by Landa, A. Z., Pulido-Gaytan, M. A., Reynoso-Hernandez, J. A., Roblin, P., Loo-Yau, J. R.

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A New and Better Method for Extracting the Parasitic Elements of On-Wafer GaN Transistors by Zarate-de Landa, A., Zuniga-Juarez, J.E., Reynoso-Hernandez, J.A., Maya-Sanchez, M.C., Piner, E.L., Linthicum, K.J.

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Advances in Linear Modeling of Microwave Transistors by Zarate-de Landa, A., Zuniga-Juarez, J., Loo-Yau, J., Reynoso-Hernandez, J., Maya-Sanchez, M., del Valle-Padilla, J.

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