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Search Results - Zetterling, C.M.
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Growth and characterization of epitaxial Ti3GeC2 thin films on 4H-SiC(0001)
by
Buchholt, K.
,
Eklund, P.
,
Jensen, J.
,
Lu, J.
,
Ghandi, R.
,
Domeij, M.
,
Zetterling, C.M.
,
Behan, G.
,
Zhang, H.
,
Lloyd Spetz, A.
,
Hultman, L.
Published in
Journal of crystal growth
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Thermal-issues for design of high power SiC MESFETs
by
Liu, W.
,
Zetterling, C.M.
,
Ostling, M.
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Journal Title
Journal Of Crystal Growth
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Subjects
Science & Technology
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Silicon Carbide
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Technology
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2
A1. Atomic Force Microscopy
1 results
1
A1. Helium Ion Microscopy
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1
A1. Surface Structure
1 results
1
A3. Physical Vapor Deposition Processes
1 results
1
Atomic Force Microscopy
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B1. Titanium Compound
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Condensed Matter: Structure, Mechanical And Thermal Properties
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Cross-Disciplinary Physics: Materials Science; Rheology
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Crystal Growth
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Crystallography
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Deposition
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Deposition By Sputtering
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Diffraction
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Engineering
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Engineering, Electrical & Electronic
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Engineering, Manufacturing
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Epitaxial Growth
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Ieee Electronic Library (Iel) Conference Proceedings
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Sciencedirect (Online Service)
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Sciencedirect Freedom Collection
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Backfile Package - Materials Science [Yms]
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Backfile Package - Physics General (Legacy) [Ypa]
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