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Search Results - Zhang, Jon Qingchun
Search Results - Zhang, Jon Qingchun
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Design and technology considerations for SiC bipolar devices: BJTs, IGBTs, and GTOs
by
Zhang, Qingchun (Jon)
,
Agarwal, Anant K.
Published in
Physica status solidi. A, Applications and materials science
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Physical phenomena affecting performance and reliability of 4H–SiC bipolar junction transistors
by
Muzykov, Peter G.
,
Kennedy, Robert M.
,
Zhang, Qingchun (Jon)
,
Capell, Craig
,
Burk, Al
,
Agarwal, Anant
,
Sudarshan, Tangali S.
Published in
Microelectronics and reliability
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Wider SOA SGT MOSFET With Self-Adjusting Negative Feedback by Patterning the Varied Resistance of Source
by
Ye, Jun
,
Mo, Weiye
,
Xiao, Xuan
,
Liu, Haonan
,
Song, Yang
,
Huang, Wei
,
Zhang, Debin
,
Li, Liang
,
Ma, Hongping
,
Zhang, Qingchun Jon
,
Zhang, D. W.
Published in
IEEE electron device letters
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SiC Power Devices for Microgrids
by
Zhang, Qingchun
,
Callanan, Robert
,
Das, M. K.
,
Ryu, Sei-Hyung
,
Agarwal, Anant K.
,
Palmour, John W.
Published in
IEEE transactions on power electronics
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Failure mechanism of 4H-SiC junction barrier Schottky diodes under harsh thermal cycling stress
by
Zhang, Yuan-Lan
,
Zhang, Jie
,
Ma, Hong-Ping
,
Chi, Yan-Qing
,
Tian, Hao-Ran
,
Liu, Jian-Hua
,
Liu, Qi-Bin
,
Chen, Zhong-Guo
,
Zhang, Qingchun Jon
Published in
Microelectronics and reliability
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Impact of an annealing atmosphere on band-alignment of a plasma-enhanced atomic layer deposition-grown Ga2O3/SiC heterojunction
by
Shen, Yi
,
Wang, An-Feng
,
Ma, Hong-Ping
,
Qi, Xin
,
Yuan, Qilong
,
Yang, Mingyang
,
Qiu, Mengting
,
Zhang, Bingxue
,
Jiang, Nan
,
Zhang, Qingchun Jon
Published in
Materials today physics
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4H–SiC BJTs with current gain of 110
by
Zhang, Qingchun (Jon)
,
Agarwal, Anant
,
Burk, Al
,
Geil, Bruce
,
Scozzie, Charles
Published in
Solid-state electronics
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Latest results on 1200 V 4H-SiC CIMOSFETs with Rsp, on of 3.9 mΩ·cm2 at 150°C
by
Zhang, Qingchun Jon
,
Gangyao Wang
,
Doan, Huy
,
Sei-Hyung Ryu
,
Hull, Brett
,
Young, Jonathan
,
Allen, Scott
,
Palmour, John
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Conference Proceeding
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4H-SiC bipolar junction transistors: From research to development - A case study: 1200 V, 20 A, stable SiC BJTs with high blocking yield
by
Qingchun Zhang
,
Burk, A.
,
Husna, F.
,
Callanan, R.
,
Agarwal, A.
,
Palmour, J.
,
Stahlbush, R.
,
Scozzie, C.
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Ultrasonic Thick Wire Bonding Process Simulation and Validation for Silicon Carbide Power Devices
by
Liu, Pan
,
Li, Liangtao
,
Zeng, Zejun
,
Zhang, Guoqi
,
Liu, Pengfei
,
Zhang, Jon Qingchun
,
Zhang, Jing
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New Improvement Results on 7.5 kV 4H-SiC p-IGBTs with Rdiff, on of 26 mΩ·cm2 at 25°C
by
Oingchun Zhang
,
Jonas, C.
,
Callanan, R.
,
Sumakeris, J.
,
Das, M.
,
Agarwal, A.
,
Palmour, J.
,
Sei-Hyung Ryu
,
Jun Wang
,
Alex Huang
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