Search Results - Zhao, Atman Yong

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  1. 1
    Reliability Baseline Management and Applications in Semiconductor Manufacturing

    Reliability Baseline Management and Applications in Semiconductor Manufacturing by Chien, Wei-Ting Kary, Zhao, Yong Atman, Zhang, Mark, Li, Ming

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  2. 2
    THE TEST-TO-TARGET METHODOLOGIES FOR THE RISK ASSESSMENT OF SEMICONDUCTOR RELIABILITY

    THE TEST-TO-TARGET METHODOLOGIES FOR THE RISK ASSESSMENT OF SEMICONDUCTOR RELIABILITY by KARY CHIEN, WEI-TING, ATMAN, ZHAO YONG, CHANG, VENSON, WU, JEFF

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  3. 3
    Investigations and detections on a new BEOL dielectric failure mechanism at advanced technologies

    Investigations and detections on a new BEOL dielectric failure mechanism at advanced technologies by Chien, Wei-Ting Kary, Zhao, Yong Atman, Zhang, Liwen, Wang, Zhijuan

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  4. 4
    Early detection and prediction of HKMG SRAM HTOL performance by WLR PBTI tests

    Early detection and prediction of HKMG SRAM HTOL performance by WLR PBTI tests by Chien, Wei-Ting Kary, Zhao, Yong Atman, Zhu, Yueqin, Song, Yongliang

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  5. 5
    Influence of I/O oxide process on the NBTI performance of 28nm HfO2-based HKMG p-MOSFETs

    Influence of I/O oxide process on the NBTI performance of 28nm HfO2-based HKMG p-MOSFETs by Chien, Wei-Ting Kary, Zhu, Yueqin, Song, Yongliang, Zhao, Yong Atman

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  6. 6
    The Failure Mechanism Worst Stress Condition for Hot Carrier Injection of NMOS

    The Failure Mechanism Worst Stress Condition for Hot Carrier Injection of NMOS by Song, Zhuo, Chen, Zhaoxing, Yong, Atman Zhao, Song, Yongliang, Wu, Jeff, Chien, Karry

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  7. 7
    Length Dependence Effect in 40nm Cu Low-k Dielectric Breakdown

    Length Dependence Effect in 40nm Cu Low-k Dielectric Breakdown by Song, Zhuo, Han, Kun, Zhang, Liwen, Atman, Zhao Y., Wang, York

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  8. 8
    The reversed intrinsic curve and voltage dependence for ultra-low k dielectrics

    The reversed intrinsic curve and voltage dependence for ultra-low k dielectrics by Chien, Wei-Ting Kary, Zhao, Atman Yong, Liwen Zhang, Cheng, Flora

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  9. 9
    A Study On The Dielectric Intrinsic Breakdown Specification

    A Study On The Dielectric Intrinsic Breakdown Specification by Han, Kun, Zhao, Yong A., Guo, Qiang, Chien, Wei-Ting Kary

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  10. 10
    Early failure model analysis and improvement of the upstream electromigration in 45nm Cu low-k interconnects

    Early failure model analysis and improvement of the upstream electromigration in 45nm Cu low-k interconnects by Wang, D., Zhao, A. Y., Yu, L., Wu, J., Chang, V., Chien, Wei-Ting Kary

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  11. 11
    The worst stress condition of hot carrier degradation on high voltage LDMOSFET

    The worst stress condition of hot carrier degradation on high voltage LDMOSFET by Huayang, Sarah Zhou, Yongliang Song, Zhuo Song, Yanju, Lisa Yu, Yong, Atman Zhao, Wu, Jeff, Chang, Venson, Chien, Kary

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  12. 12
    The electromigration failure mechanism for TSV process

    The electromigration failure mechanism for TSV process by Yong, L. V., Zhao, Atman, Chen, Canny

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