Search Results - Zmeck, M.

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  1. 1
    Ion beam induced charge microscopy studies of power diodes

    Ion beam induced charge microscopy studies of power diodes by Zmeck, M, Balk, L J, Osipowicz, T, Watt, F, Phang, J C H, Khambadkone, A M, Niedernostheide, F-J, Schulze, H-J

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  2. 2
    Modeling of deep buried structures in high-power devices based on proton beam induced charge microscopy

    Modeling of deep buried structures in high-power devices based on proton beam induced charge microscopy by Zmeck, M., Balk, L., Osipowicz, T., Watt, F., Phang, J., Khambadkone, A., Niedernostheide, F.-J., Schulze, H.-J.

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  3. 3
    IBIC analysis of high-power devices

    IBIC analysis of high-power devices by Osipowicz, T., Zmeck, M., Watt, F., Fiege, G., Balk, L., Niedernostheide, F., Schulze, H.-J.

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  4. 4
    Analysis of E-field distributions within high-power devices using IBIC microscopy

    Analysis of E-field distributions within high-power devices using IBIC microscopy by Zmeck, M., Balk, L.J., Heiderhoff, R., Osipowicz, T., Watt, F., Phang, J.C.H., Khambadkone, A.M., Niedernostheide, F.J., Schulze, H.J.

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  5. 5
    Analysis of high-power devices using proton beam induced charge microscopy

    Analysis of high-power devices using proton beam induced charge microscopy by Zmeck, M., Phang, J., Bettiol, A., Osipowicz, T., Watt, F., Balk, L., Niedernostheide, F.-J., Schulze, H.-J., Falck, E., Barthelmess, R.

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  6. 6
    Analysis of high-power devices using proton beam induced currents

    Analysis of high-power devices using proton beam induced currents by Zmeck, M., Osipowicz, T., Watt, F., Niedernostheide, F., Schulze, H.-J., Fiege, G.B.M., Balk, L.

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  7. 7
    Analysis of premature breakdown in high-power devices using IBIC microscopy

    Analysis of premature breakdown in high-power devices using IBIC microscopy by Zmeck, M., Balk, L.J., Pugatschow, A., Niedernostheide, F.-J., Schulze, H.-J., Osipowicz, T., Watt, F., Phang, J.C.H., Khambadkone, A.M.

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