Search Results - Zoo, Yeongseok

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  1. 1
    Comparison of preferred orientation and stress in silver thin films on different substrates using x-ray diffraction

    Comparison of preferred orientation and stress in silver thin films on different substrates using x-ray diffraction by Zoo, Yeongseok, Alford, T. L.

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  2. 2
    Investigation of coefficient of thermal expansion of silver thin film on different substrates using X-ray diffraction

    Investigation of coefficient of thermal expansion of silver thin film on different substrates using X-ray diffraction by Zoo, Yeongseok, Adams, Daniel, Mayer, J.W., Alford, T.L.

    Published in Thin solid films
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  3. 3
    Improved surface morphology and texture of Ag films on indium tin oxide via Cu additions

    Improved surface morphology and texture of Ag films on indium tin oxide via Cu additions by Han, H., Zoo, Yeongseok, Mayer, J. W., Alford, T. L.

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  4. 4
    Copper enhanced (111) texture in silver thin films on amorphous SiO2

    Copper enhanced (111) texture in silver thin films on amorphous SiO2 by Zoo, Yeongseok, Han, H., Alford, T. L.

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  5. 5
    Influence of defects and processing parameters on the properties of indium tin oxide films on polyethylene napthalate substrate

    Influence of defects and processing parameters on the properties of indium tin oxide films on polyethylene napthalate substrate by Han, H., Zoo, Yeongseok, Bhagat, S. K., Lewis, J. S., Alford, T. L.

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  6. 6
    Comparison of preferred orientation and stress in silver thin filmson different substrates using x-ray diffraction

    Comparison of preferred orientation and stress in silver thin filmson different substrates using x-ray diffraction by Zoo, Yeongseok, Alford, T. L.

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  7. 7
    Copper enhanced (111) texture in silver thin films on amorphous Si O 2

    Copper enhanced (111) texture in silver thin films on amorphous Si O 2 by Zoo, Yeongseok, Han, H., Alford, T. L.

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  8. 8
    Strain characterization of strained silicon on insulator including the effects of rotational misalignment

    Strain characterization of strained silicon on insulator including the effects of rotational misalignment by Zoo, Yeongseok, Theodore, N. D., Alford, T. L.

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  9. 9
    Influence of defects and processing parameters on the propertiesof indium tin oxide films on polyethylene napthalate substrate

    Influence of defects and processing parameters on the propertiesof indium tin oxide films on polyethylene napthalate substrate by Han, H., Zoo, Yeongseok, Bhagat, S. K., Lewis, J. S., Alford, T. L.

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