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Search Results - Zumuukhorol, Munkhsaikhan
Search Results - Zumuukhorol, Munkhsaikhan
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Effect of a SiO₂ Anti-reflection Layer on the Optoelectronic Properties of Germanium Metal-semiconductor-metal Photodetectors
by
Zumuukhorol, Munkhsaikhan
,
Khurelbaatar, Zagarzusem
,
Kim, Jong-Hee
,
Shim, Kyu-Hwan
,
Lee, Sung-Nam
,
Leem, See-Jong
,
Choi, Chel-Jong
Published in
Journal of semiconductor technology and science
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Enhancing the performance of surface-textured Ge Schottky photodetectors using the electroless chemical etching method
by
Zumuukhorol, Munkhsaikhan
,
Boldbaatar, Sosorburam
,
Khurelbaatar, Zagarzusem
,
Baek, Ji-Yoon
,
Shim, Kyu-Hwan
,
Choi, Chel-Jong
Published in
Materials science in semiconductor processing
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Structural engineering of single-crystal-like perovskite nanocrystals for ultrasensitive photodetector applications
by
Kim, Mi Kyong
,
Munkhsaikhan, Zumuukhorol
,
Han, Se Gyo
,
Park, Su Min
,
Jin, Haedam
,
Cha, Jeongbeom
,
Yang, Seok Joo
,
Seo, Jungyoon
,
Lee, Hwa Sung
,
Choi, Chel-Jong
,
Kim, Min
Published in
Journal of materials chemistry. C, Materials for optical and electronic devices
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Temperature-dependent Schottky diode behavior of Ni Schottky contacts to α-Ga2O3 film epitaxially grown on sapphire substrate
by
Boldbaatar, Sosorburam
,
Janardhanam, V.
,
Zumuukhorol, Munkhsaikhan
,
Lee, Hoon-Ki
,
Lee, Hae-Yong
,
Kim, Hyo Jung
,
Shim, Kyu-Hwan
,
Choi, Chel-Jong
Published in
Materials science in semiconductor processing
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Application of a ZnO nanorod layer to display retarder: dependence of the optical property on synthesis conditions
by
Nguyen, Van Chuc
,
Kim, Jongyoon
,
Dang, Phuc Toan
,
Zumuukhorol, Munkhsaikhan
,
Cuong, Tran Viet
,
Hong, Chang-Hee
,
Lee, Ji-Hoon
Published in
Optical materials express
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Effects of finger dimension on low-frequency noise and optoelectronic properties of Ge metal-semiconductor-metal photodetectors with interdigitated Pt finger electrodes
by
Zumuukhorol, Munkhsaikhan
,
Khurelbaatar, Zagarzusem
,
Yuk, Shim-Hoon
,
Won, Jonghan
,
Lee, Sung-Nam
,
Choi, Chel-Jong
Published in
Microelectronics and reliability
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Effect of a SiO 2 Anti-reflection Layer on the Optoelectronic Properties of Germanium Metal-semiconductor-metal Photodetectors
by
Zumuukhorol, Munkhsaikhan
,
Khurelbaatar, Zagarzusem
,
Kim, Jong-Hee
,
Shim, Kyu-Hwan
,
Lee, Sung-Nam
,
Leem, See-Jong
,
Choi, Chel-Jong
Published in
Journal of semiconductor technology and science
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