Search Results - da Rosa, E.B.O.

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    Ion beam studies of high- k ultrathin films deposited on Si

    Ion beam studies of high- k ultrathin films deposited on Si by Pezzi, R.P., Krug, C., da Rosa, E.B.O., Morais, J., Miotti, L., Baumvol, I.J.R.

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    Characterization by ion beams of surfaces and interfaces of alternative materials for future microelectronic devices

    Characterization by ion beams of surfaces and interfaces of alternative materials for future microelectronic devices by Krug, C., Stedile, F.C., Radtke, C., da Rosa, E.B.O., Morais, J., Freire, F.L., Baumvol, I.J.R.

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    Narrow nuclear resonance profiling of Al with subnanometric depth resolution

    Narrow nuclear resonance profiling of Al with subnanometric depth resolution by da Rosa, E.B.O., Krug, C., Stedile, F.C., Morais, J., Baumvol, I.J.R.

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    Ion beams as analytical tools in the thermal growth of ultrathin silicon oxide films

    Ion beams as analytical tools in the thermal growth of ultrathin silicon oxide films by da Rosa, E.B.O., Gonçalves, S., de Almeida, R.M.C., Baumvol, I.J.R., Stedile, F.C.

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