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Residual stresses in microelectronics induced by thermoset packaging materials during cure
by
Meuwissen, Marcel H.H.
,
de Boer, Hedzer A.
,
Steijvers, Henk L.A.H.
,
Schreurs, Piet J.G.
,
Geers, Marc G.D.
Published in
Microelectronics and reliability
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Microelectronics And Reliability
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Design. Technologies. Operation Analysis. Testing
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