Search Results - de Kruif, R.C.M.

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  1. 1
    Proximity gettering of transition metals in silicon by ion implantation

    Proximity gettering of transition metals in silicon by ion implantation by Overwijk, M.H.F., Politiek, J., de Kruif, R.C.M., Zalm, P.C.

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  2. 2
    Problems in the deconvolution of SIMS depth profiles using delta-doped test structures

    Problems in the deconvolution of SIMS depth profiles using delta-doped test structures by Zalm, P.C., de Kruif, R.C.M.

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  3. 3
    Time scales of transient enhanced diffusion: free and clustered interstitials

    Time scales of transient enhanced diffusion: free and clustered interstitials by Cowern, N.E.B., Huizing, H.G.A., Stolk, P.A., Visser, C.C.G., de Kruif, R.C.M., Kyllesbech Larsen, K., Privitera, V., Nanver, L.K., Crans, W.

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  4. 4
    A high-resolution study of two-dimensional oxidation-enhanced diffusion in silicon

    A high-resolution study of two-dimensional oxidation-enhanced diffusion in silicon by van Dort, M.J., Lifka, H., Zalm, P.C., de Kruif, R.C.M., de Boer, W.B., Woerlee, P.H., Juffermans, C.A.H., Walker, A.J., Slotboom, J.W., Cowern, N.E.B.

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