Score gains on g-loaded tests: No g by te Nijenhuis, Jan, van Vianen, Annelies E.M., van der Flier, Henk

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Misfit dislocation formation in lattice-mismatched III - V heterostructures grown by metal - organic vapour phase epitaxy by Nijenhuis, J te, Wel, P J van der, Eck, E R H van, Giling, L J

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Comparability of IQ scores over time by Must, Olev, te Nijenhuis, Jan, Must, Aasa, van Vianen, Annelies E.M.

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Two-dimensional model for OBIC studies on misfit dislocations in GaAs-(In,Ga)As heterostructures by Wel, P J van der, Nijenhuis, J te, Giling, L J

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Comparability of personality test scores for immigrants and majority group members: Some dutch findings by te Nijenhuis, Jan, van der Flier, Henk, van Leeuwen, Liesbeth

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Does Cultural Background Influence the Intellectual Performance of Children from Immigrant Groups? The RAKIT Intelligence Test for Immigrant Children by te Nijenhuis, Jan, Tolboom, Elsbeth, Resing, Wilma, Bleichrodt, Nico

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Immigrant–majority group differences in cognitive performance: Jensen effects, cultural effects, or both? by te Nijenhuis, Jan, van der Flier, Henk

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Dissociated V-shaped dislocation model for the relaxation of strained single heterostructures by te Nijenhuis, J, van Well, H.F.J.M, Bongers, M.M.G, Giling, L.J

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Total X-ray scattering studies of nanocrystalline and amorphous organic and inorganic compounds by Beckers, D., Gateshki, M., te Nijenhuis, J.

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Short-term memory as an additional predictor of school achievement for East-African children? by te Nijenhuis, Jan, van der Flier, Henk

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Incorporation of lithium in single crystal diamond: diffusion profiles and optical and electrical properties by te Nijenhuis, J., Cao, G.Z., Smits, P.C.H.J., van Enckevort, W.J.P., Giling, L.J., Alkemade, P.F.A., Nesládek, M., Remeš, Z.

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The Use of Safety Suitability Tests for The Assessment of Immigrant and Majority Group Job Applicants by Te Nijenhuis, Jan, Van Der Flier, Henk

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Dependence of indium incorporation upon the substrate misorientation during growth of InxGa11 - xAs by metalorganic vapour phase epitaxy by TE NIJENHUIS, J, HAGEMAN, P. R, GILING, L. J

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Dependence of impurity incorporation upon substrate misorientation during GaAs growth by metalorganic vapour phase epitaxy by Hageman, P.R., te Nijenhuis, J., Anders, M.J., Giling, L.J.

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Short-term memory as an additional predictor of school achievement for immigrant children? by te Nijenhuis, Jan, Resing, Wilma, Tolboom, Elsbeth, Bleichrodt, Nico

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Practice and Coaching on IQ Tests: Quite a Lot of g by Te Nijenhuis, Jan, Voskuijl, Olga F., Schijve, Natasja B.

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High-spatial-resolution photoluminescence studies on misfit dislocations in lattice-mismatched III-V heterostructures by Wel, P J van der, Nijenhuis, J te, Eck, E R H van, Giling, L J

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GROUP DIFFERENCES IN MEAN INTELLIGENCE FOR THE DUTCH AND THIRD WORLD IMMIGRANTS by TE NIJENHUIS, JAN, VAN DER FLIER, HENK

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The influence of substrate orientation and mis-orientation on the Si-doping of GaAs grown by MOVPE by Tang, X., Nijenhuis, J. te, Li, Y., Giling, L.J.

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Critical layer thickness of MOVPE-grown GaAs on InxGa1−xAs by te Nijenhuis, J., van der Wel, P.J., van Asten, R.W.F., Hageman, P.R., Giling, L.J.

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