Performance Validation of Selective Screening Agars for Guiding Antimicrobial Prophylaxis in Patients Undergoing Prostate Biopsy by Tops, Sofie C M, Bruens, Marlie, van Mook-Vermulst, Sacha, Lamers-Jansen, Diane, Engel, Tobias, van den Brink, Ger, van Duuren, Rob, Wertheim, Heiman F L, Kolwijck, Eva

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Experimental Characterization of the Vertical Position of the Trapped Charge in Si Nitride-Based Nonvolatile Memory Cells by Arreghini, A., Driussi, F., Vianello, E., Esseni, D., van Duuren, M.J., Golubovic, D.S., Akil, N., van Schaijk, R.

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Impact of Device Layout and Annealing Process During the Passivation of Interface States in Presence of Silicon Nitride Layers by Driussi, F., Selmi, L., Akil, N., van Duuren, M.J., van Schaijk, R.

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Optimization of embedded compact nonvolatile memories for sub-100-nm CMOS generations by Akil, N., van Duuren, M., Slotboom, M., Baks, W., Goarin, P., van Schaijk, R., Tello, P.G., Cuppens, R.

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Impact of Device Layout and Annealing Process During the Passivation of Interface States in Presence of Silicon Nitride Layers : International Conference on Microelectronic Test St... by DRIUSSI, Francesco, SELMI, Luca, AKIL, Nader, VAN DUUREN, Michiel J, VAN SCHAIJK, Rob

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Reliability Comparison of Al2O3 and HfSiON for use as Interpoly Dielectric in Flash Arrays by Miranda, A.H., van Schaijk, R., van Duuren, M., Akil, N., Golubovic, D.S.

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Oxide–nitride–oxide layer optimisation for reliable embedded SONOS memories by van Schaijk, Rob, van Duuren, Michiel, Yuet Mei, Wan, van der Jeugd, Kees, Rothschild, Aude, Demand, Marc

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Pushing the scaling limits of embedded non-volatile memories with high-K materials by van Duuren, M., van Schaijk, R., Slotboom, M., Tello, P.G., Akil, N., Miranda, A.H., Golubovic, D.S.

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Junction Optimization for Embedded 40nm FN/FN Flash Memory by Baiano, Alessandro, van Duuren, Michiel, van der Vegt, Erik, Schippers, Bob, Beurze, Robert, Tajari Mofrad, Daniel, van Zwol, Hans, Yu Chen, Chiang, Jed, Lokker, Han, van Dijk, Kitty, Verbree, Jouke, Yi Ning Chen, Garbe, Jochen, Verhaar, Rob, Dormans, Do

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Performance and reliability features of advanced nonvolatile memories based on discrete traps (silicon nanocrystals, SONOS) by Barbara De Salvo, Gerardi, C., van Schaijk, R., Lombardo, S.A., Corso, D., Plantamura, C., Serafino, S., Ammendola, G., van Duuren, M., Goarin, P., Mei, W.Y., van der Jeugd, K., Baron, T., Gely, M., Mur, P., Deleonibus, S.

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