Search Results - van Spengen, W.M.

  • Showing 1 - 14 results of 14
Refine Results
  1. 1
    Dosed carbon precipitation and graphene layer number control on nickel micro-electromechanical systems surfaces

    Dosed carbon precipitation and graphene layer number control on nickel micro-electromechanical systems surfaces by Gkouzou, A., Janssen, G.C.A.M., van Spengen, W.M.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  2. 2
    MEMS-based fast scanning probe microscopes

    MEMS-based fast scanning probe microscopes by Tabak, F.C., Disseldorp, E.C.M., Wortel, G.H., Katan, A.J., Hesselberth, M.B.S., Oosterkamp, T.H., Frenken, J.W.M., van Spengen, W.M.

    Published in Ultramicroscopy
    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  3. 3
    On the physics of stiction and its impact on the reliability of microstructures

    On the physics of stiction and its impact on the reliability of microstructures by Van Spengen, W. Merlijn, Puers, Robert, De Wolf, Ingrid

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  4. 4
    Techniques to study the reliability of metal RF MEMS capacitive switches

    Techniques to study the reliability of metal RF MEMS capacitive switches by De Wolf, I., van Spengen, W.M.

    Get full text
    Items that cite this one
    Article
    Save to List
    Saved in:
  5. 5
    The influence of the package environment on the functioning and reliability of RF-MEMS switches

    The influence of the package environment on the functioning and reliability of RF-MEMS switches by van Spengen, W.M., Czarnecki, P., Puers, R., van Beek, J.T.M., De Wolf, I.

    Request full text
    Conference Proceeding
    Save to List
    Saved in:
  6. 6
    The prediction of stiction failures in MEMS

    The prediction of stiction failures in MEMS by van Spengen, W.M., Puers, R., De Wolf, I.

    Get full text
    Items that this one cites
    Items that cite this one
    Magazinearticle
    Save to List
    Saved in:
  7. 7
    Experimental characterization of stiction due to charging in RF MEMS

    Experimental characterization of stiction due to charging in RF MEMS by van Spengen, W.M., Puers, R., Mertens, R., De Wolf, I.

    Request full text
    Items that cite this one
    Conference Proceeding
    Save to List
    Saved in:
  8. 8
    A 'nano-battering ram' for measuring surface forces: obtaining force–distance curves and sidewall stiction data with a MEMS device

    A 'nano-battering ram' for measuring surface forces: obtaining force–distance curves and sidewall stiction data with a MEMS device by Merlijn van Spengen, W, Bakker, Elco, Frenken, Joost W M

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  9. 9
    MEMS-based high speed scanning probe microscopy

    MEMS-based high speed scanning probe microscopy by Disseldorp, E. C. M., Tabak, F. C., Katan, A. J., Hesselberth, M. B. S., Oosterkamp, T. H., Frenken, J. W. M., van Spengen, W. M.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  10. 10
    The Leiden MEMS Tribometer: Real Time Dynamic Friction Loop Measurements With an On-Chip Tribometer

    The Leiden MEMS Tribometer: Real Time Dynamic Friction Loop Measurements With an On-Chip Tribometer by van Spengen, W. Merlijn, Frenken, Joost W. M.

    Published in Tribology letters
    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  11. 11
    The description of friction of silicon MEMS with surface roughness: virtues and limitations of a stochastic Prandtl-Tomlinson model and the simulation of vibration-induced friction reduction

    The description of friction of silicon MEMS with surface roughness: virtues and limitations of a stochastic Prandtl-Tomlinson model and the simulation of vibration-induced friction... by van Spengen, W Merlijn, Turq, Viviane, Frenken, Joost W M

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  12. 12
    Video-rate scanning probe control challenges: setting the stage for a microscopy revolution

    Video-rate scanning probe control challenges: setting the stage for a microscopy revolution by Rost, M. J., van Baarle, G. J. C., Katan, A. J., van Spengen, W. M., Schakel, P., van Loo, W. A., Oosterkamp, T. H., Frenken, J. W. M.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  13. 13
    Microscale Friction Reduction by Normal Force Modulation in MEMS

    Microscale Friction Reduction by Normal Force Modulation in MEMS by van Spengen, W. M., Wijts, G. H. C. J., Turq, V., Frenken, J. W. M.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:
  14. 14
    Response to "Comment on 'MEMS-based high speed scanning probe microscopy'" [ Rev. Sci. Instrum. 81 , 117101 ( 2010 ) ]

    Response to "Comment on 'MEMS-based high speed scanning probe microscopy'" [ Rev. Sci. Instrum. 81 , 117101 ( 2010 ) ] by Disseldorp, E. C. M., Tabak, F. C., Katan, A. J., Hesselberth, M. B. S., Oosterkamp, T. H., Frenken, J. W. M., van Spengen, W. M.

    Get full text
    Items that this one cites
    Items that cite this one
    Article
    Save to List
    Saved in:

Search Tools: