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Fabrication of submicron single-crystalline and bamboo A1 lines by recrystallization
by
van den Homberg, M.J.C.
,
Alkemade, P.F.A.
,
Verbruggen, A.H.
,
Dirks, A.G.
,
Hurd, J.L.
,
Radelaar, S.
Published in
Microelectronic engineering
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Stress in Al, AlSiCu, and AlVPd films on oxidized Si substrates
by
Leusink, G.J.
,
Lokker, J.P.
,
van den Homberg, M.J.C.
,
Jongste, J.F.
,
Oosterlaken, T.G.M.
,
Janssen, G.C.A.M.
,
Radelaar, S.
Published in
Applied surface science
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