Efficient Multiphase Test Set Embedding for Scan-based Testing

In this paper a new test set embedding method with reseeding for scan-based testing is proposed. The bit sequences of multiple cells of an LFSR, which is used as test pattern generator, are exploited for effectively encoding the test set of the core under test (multiphase architecture). A new algori...

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Bibliographic Details
Main Authors: Kalligeros, E., Kavousianos, X., Nikolos, D.
Format: Conference Proceeding
Language:English
Subjects:
Circuit faults
Circuit testing
Costs
Educational programs
Encoding
Hardware > Hardware test
Hardware > Hardware validation
Hardware > Hardware validation > Functional verification
Hardware > Robustness
Informatics
Sequential analysis
System testing
Test pattern generators
Time to market
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Description
Summary:In this paper a new test set embedding method with reseeding for scan-based testing is proposed. The bit sequences of multiple cells of an LFSR, which is used as test pattern generator, are exploited for effectively encoding the test set of the core under test (multiphase architecture). A new algorithm which comprises four heuristic criteria is introduced for efficiently selecting the required seeds and LFSR cells. Also, a cost metric for assessing the quality of the algorithm's results is proposed. By using this metric, the process of determining proper values for the algorithm's input parameters is significantly simplified. The proposed method compares favorably with the most recent and effective test set embedding techniques in the literature.
ISSN:1948-3287
1948-3295
DOI:10.1109/ISQED.2006.56