Deflection Measurements of Laminated Thin Plates Using Electronic Speckle Pattern Interferometry

An adaptive Electronic speckle Pattern Interferometry (ESPI) system has been developed to measure out-of-plane deformation of laminates subjected to quasi-static loads. The system was installed and setup for calibration with aluminum specimens mounted to an optical breadboard. Several parameters of...

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Published in:Journal of composites technology & research 2002, Vol.24 (4), p.215-223
Main Authors: Golda, D, Kedlaya, D, Pelegri, AA
Format: Article
Language:English
Subjects:
Applied sciences
Exact sciences and technology
Forms of application and semi-finished materials
Laminates
Polymer industry, paints, wood
Technology of polymers
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cited_by cdi_FETCH-LOGICAL-a367t-f97105504a2ea8be4520fe76bde10957b6b176620e1d0dfa4db94f223b1d77473
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description An adaptive Electronic speckle Pattern Interferometry (ESPI) system has been developed to measure out-of-plane deformation of laminates subjected to quasi-static loads. The system was installed and setup for calibration with aluminum specimens mounted to an optical breadboard. Several parameters of the test fixture and system's geometry needed to be adjusted before usable fringe patterns were obtained, and the system's resolution and range were determined. The ESPI system was then reconfigured for use with composite specimens subjected to quasi-static loading. Results of fringe patterns, calibration curves and deformation patterns are presented for A1 and graphite/epoxy specimens. The ESPI resolution was estimated at 25 μm per fringe for the A1 surface, and 11 μm per fringe for the composite laminate. From the results, it can be concluded that the usable deflection range is limited at high system resolutions.
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subjects Applied sciences
Exact sciences and technology
Forms of application and semi-finished materials
Laminates
Polymer industry, paints, wood
Technology of polymers
title Deflection Measurements of Laminated Thin Plates Using Electronic Speckle Pattern Interferometry
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