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Atomic Resolution Imaging of YAlO3:Ce in the Chromatic and Spherical Aberration Corrected PICO Transmission Electron Microscope

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Bibliographic Details
Published in:	Microscopy and microanalysis 2017-07, Vol.23 (S1), p.422-423
Main Authors:	Jin, Lei, Barthel, Juri, Lin Jia, Chun, Urban, Knut W.
Format:	Article
Language:	English
Subjects:	Advances and Applications of Aberration-Corrected Electron Microscopy Analytical and Instrumentation Science Symposia
Online Access:	Get full text
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