Pressure-induced phase transitions in single-crystalline Cu4Bi4S9 nanoribbons

In situ angle dispersive synchrotron X-ray diffraction and Raman scattering measurements under pressure are em- ployed to study the structural evolution of Cu4Bi4S9 nanoribbons, which are fabricated by using a facile solvothermal method. Both experiments show that a structural phase transition occur...

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Published in:中国物理B：英文版 2013-11 (11), p.440-444
Main Author: 胡靖宇 李劲 张思佳 赵豪飞 张庆华 姚湲 赵清 石丽洁 邹炳锁 李延春 李晓东 刘景 朱恪 刘玉龙 靳常青 禹日成
Format: Article
Language:English
Subjects:
单晶
压力诱导
同步辐射X射线衍射
散射测量
构造演化
电输运特性
纳米带
结构相变
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Summary:In situ angle dispersive synchrotron X-ray diffraction and Raman scattering measurements under pressure are em- ployed to study the structural evolution of Cu4Bi4S9 nanoribbons, which are fabricated by using a facile solvothermal method. Both experiments show that a structural phase transition occurs near 14.5 GPa, and there is a pressure-induced re- versible amorphization at about 25.6 GPa. The electrical transport property of a single Cu4Bi4S9 nanoribbon under different pressures is also investigated.
ISSN:1674-1056
2058-3834
DOI:10.1088/1674-1056/22/11/116201